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Philippe Duvauchelle
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Cited by
Year
X-ray tomography in material science
J Baruchel, JY Buffiere, E Maire
5232000
A computer code to simulate X-ray imaging techniques
P Duvauchelle, N Freud, V Kaftandjian, D Babot
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2000
1722000
Effective atomic number in the Rayleigh to Compton scattering ratio
P Duvauchelle, G Peix, D Babot
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999
1521999
Fast and robust ray casting algorithms for virtual X-ray imaging
N Freud, P Duvauchelle, JM Létang, D Babot
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006
752006
Deterministic simulation of first-order scattering in virtual X-ray imaging
N Freud, P Duvauchelle, SA Pistrui-Maximean, JM Létang, D Babot
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004
652004
Concept of effective atomic number and effective mass density in dual-energy X-ray computed tomography
A Bonnin, P Duvauchelle, V Kaftandjian, P Ponard
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014
622014
Rayleigh to Compton ratio computed tomography using synchrotron radiation
P Duvauchelle, G Peix, D Babot
NDT & E International 33 (1), 23-31, 2000
502000
Energy dispersive X-ray diffraction to identify explosive substances: Spectra analysis procedure optimization
C Crespy, P Duvauchelle, V Kaftandjian, F Soulez, P Ponard
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2010
432010
X-ray phase contrast image simulation
A Peterzol, J Berthier, P Duvauchelle, C Ferrero, D Babot
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007
402007
X-ray Compton backscattering techniques for process tomography: imaging and characterization of materials
P Zhu, P Duvauchelle, G Peix, D Babot
Measurement Science and Technology 7 (3), 281, 1996
391996
Simulation of X-ray NDT imaging techniques
N Freud, P Duvauchelle, D Babot
Proceedings of the 15th world conference on non-destructive testing 15, 15-21, 2000
262000
Material decomposition in X-ray spectral CT using multiple constraints in image domain
B Xie, T Su, V Kaftandjian, P Niu, F Yang, M Robini, Y Zhu, P Duvauchelle
Journal of Nondestructive Evaluation 38, 1-9, 2019
212019
Effect of grain size on stability of X-ray diffraction patterns used for threat detection
B Ghammraoui, V Rebuffel, J Tabary, C Paulus, L Verger, P Duvauchelle
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2012
212012
New Developments in Virtual X‐ray Imaging: Fast Simulation Using a Deterministic Approach
N Freud, P Duvauchelle, D Babot
AIP Conference Proceedings 657 (1), 553-560, 2003
182003
New software to model energy dispersive x-ray diffraction in polycrystalline materials
B Ghammraoui, J Tabary, S Pouget, C Paulus, V Moulin, L Verger, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2012
172012
Modeling-based optimization study for an EDXRD system in a portable configuration
A Peterzol, P Duvauchelle, V Kaftandjian, P Ponard
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011
162011
A 2D multiresolution image reconstruction method in X-ray computed tomography
M Costin, D Lazaro-Ponthus, S Legoupil, P Duvauchelle, V Kaftandjian
Journal of X-ray science and technology 19 (2), 229-247, 2011
162011
Optimisation of the process of X-ray tomography applied to the detection of defects in composites materials
C Uhry, F Guillet, P Duvauchelle, V Kaftandjian
Digital Industrial Radiology and Computed Tomography, 2015
112015
Conception of a high resolution x-ray computed tomography device; application to damage initiation imaging inside materials
E Cendre, P Duvauchelle, G Peix, JY Buffiere, D Babot
Proceedings of the 1st World Congress on Industrial Process Tomography, 362-369, 1999
101999
ROI-wise material decomposition in spectral photon-counting CT
B Xie, P Niu, T Su, V Kaftandjian, L Boussel, P Douek, F Yang, ...
IEEE Transactions on Nuclear Science 67 (6), 1066-1075, 2020
82020
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