| Mitigating total-ionizing-dose-induced threshold-voltage shifts using back-gate biasing in 22-nm FD-SOI transistors AC Watkins, ST Vibbert, JV D’Amico, JS Kauppila, TD Haeffner, DR Ball, ... IEEE Transactions on Nuclear Science 69 (3), 374-380, 2022 | 9 | 2022 |
| In-situ measurement of TID-induced leakage using on-chip frequency modulation ST Vibbert, AC Watkins, JV D’Amico, MW McKinney, DS Vibbert, ... IEEE Transactions on Nuclear Science 69 (3), 367-373, 2022 | 4 | 2022 |
| A novel on-chip photocurrent measurement circuit for sub-50nm silicon-on-insulator technologies ST Vibbert, MW McKinney, JV D'Amico, EW Richards, AC Watkins, ... Journal of Radiation Effects, Research and Engineering 39 (1), 336-344, 2021 | 3 | 2021 |
| Analysis of single-event upsets and transients in 22nm fully-depleted silicon-on-insulator logic JV D'Amico, ST Vibbert, AC Watkins, BC Fahrenkrug, TD Haeffner, ... IEEE Transactions on Nuclear Science, 2023 | 2 | 2023 |
| A RHBD high-sample-rate clocked comparator for SOI technologies MW McKinney, JS Kauppila, ST Vibbert, AC Watkins, JV D'Amico, ... Government Microcircuit Applications & Critical Technology Conference 2021, 2021 | | 2021 |
| An on-chip photocurrent measurement circuit using sequential switched capacitor integration ST Vibbert, MW McKinney, JV D'Amico, EW Richards, HJ Wilson, ... Government Microcircuit Applications & Critical Technology Conference 2020, 2020 | | 2020 |
