Katsuichi Kitagawa
Katsuichi Kitagawa
Unknown affiliation
Verified email at nifty.ne.jp - Homepage
Title
Cited by
Cited by
Year
Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory
A Hirabayashi, H Ogawa, K Kitagawa
Applied Optics 41 (23), 4876-4883, 2002
972002
Thin-film thickness profile measurement by three-wavelength interference color analysis
K Kitagawa
Applied optics 52 (10), 1998-2007, 2013
582013
Single-shot surface profiling by local model fitting
M Sugiyama, H Ogawa, K Kitagawa, K Suzuki
Applied Optics 45 (31), 7999-8005, 2006
542006
Fast surface profiling by multi-wavelength single-shot interferometry
K Kitagawa
International Journal of Optomechatronics 4 (2), 136-156, 2010
412010
Single-shot surface profiling by multiwavelength interferometry without carrier fringe introduction
K Kitagawa
Journal of Electronic Imaging 21 (2), 021107, 2012
392012
Development of new hybrid transmission for 2009 Prius
A Takasaki, T Mizutani, K Kitagawa, T Yamahana, K Odaka, T Kuzuya, ...
Proc. EVS24 Int. Battery, Hybrid Fuel Cell Elect. Veh. Symp., 2009
252009
Surface and thickness profile measurement of a transparent film by three-wavelength vertical scanning interferometry
K Kitagawa
Optics letters 39 (14), 4172-4175, 2014
222014
Fast surface profiler by white-light interferometry using a new algorithm, the SEST algorithm
A Hirabayashi, H Ogawa, K Kitagawa
Optical Manufacturing and Testing IV 4451, 356-367, 2001
222001
Two-wavelength single-shot interferometry
K Kitagawa, M Sugiyama, T Matsuzaka, H Ogawa, K Suzuki
SICE Annual Conference 2007, 724-728, 2007
172007
Multiwavelength single-shot interferometry without carrier fringe introduction
K Kitagawa
Tenth International Conference on Quality Control by Artificial Vision 8000 …, 2011
162011
System and method for tracking print system utilization
PON Sandfort, SS Simpson
US Patent 7,148,986, 2006
142006
Thin film thickness profile measurement using an interferometric surface profiler
K Kitagawa
Optomechatronic Sensors and Instrumentation III 6716, 671607, 2007
132007
3D profiling of a transparent film using white-light interferometry
K Kitagawa
SICE 2004 Annual Conference 1, 585-590, 2004
132004
Surface profile measuring method and apparatus
H Ogawa, A Hirabayashi, K Kitagawa
US Patent 6,501,553, 2002
122002
Burning rate anomaly of composite propellant grains
H Hasegawa, M Fukunaga, K Kitagawa, T Shimada
Combustion, Explosion, and Shock Waves 49 (5), 583-592, 2013
112013
Simultaneous measurement of film surface topography and thickness variation using white-light interferometry
K Kitagawa
Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems 6375 …, 2006
92006
Fast surface profiling by white-light interferometry using a sampling theorem for band-pass signals
A Hirabayashi, H Ogawa, T Mizutani, K Nagai, K Kitagawa
Transactions of the Society of Instrument and Control Engineers 36 (1), 16-25, 2000
92000
Recent trends in white-light interferometry
K Kitagawa
Two-and Three-Dimensional Methods for Inspection and Metrology IV 6382, 638201, 2006
82006
Method for measuring surface profile, and apparatus using the same
M Sugiyama, H Ogawa, K Kitagawa, K Suzuki
US Patent 7,852,489, 2010
72010
Iteratively-reweighted local model fitting method for adaptive and accurate single-shot surface profiling
N Kurihara, M Sugiyama, H Ogawa, K Kitagawa, K Suzuki
Applied optics 49 (22), 4270-4277, 2010
72010
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