Reducing Regression Test Suites using the Word2Vec Natural Language Processing Tool. B Afshinpour, R Groz, MR Amini, Y Ledru, C Oriat SEED/NLPaSE@ APSEC, 43-53, 2020 | 9 | 2020 |
Correlating test events with monitoring logs for test log reduction and anomaly prediction B Afshinpour, R Groz, MR Amini 2022 IEEE International Symposium on Software Reliability Engineering …, 2022 | 3 | 2022 |
Telemetry-based Software Failure Prediction by Concept-space Model Creation B Afshinpour, R Groz, MR Amini 2022 IEEE 22nd International Conference on Software Quality, Reliability and …, 2022 | 2 | 2022 |
Exploitation de journaux logiciels avec des techniques d'apprentissage automatique B Afshinpour Université Grenoble Alpes, 2023 | | 2023 |
Mining Software Logs with Machine Learning Techniques B Afshinpour Université grenoble alpes, 2023 | | 2023 |
Telemetry-based Software Failure Prediction by Concept-space Model Creation MRA Bahareh Afshinpour, Roland Groz The 22nd International Conference on Software Quality, Reliability and …, 2022 | | 2022 |
Apprentissage collaboratif pour la réduction des log de test et la prédiction des anomalies sur les log de monitoring B Afshinpour, R Groz, MR Amini Conférence d'Apprentissage (CAp), 2022 | | 2022 |
Reducing Regression Test Suites using the Word2Vec Natural Language Processing Tool Bahareh Afshinpour, Roland Groz, Massih-Reza Amini, Yves Ledru, Catherine Oriat NLPaSE 2020 - 1st Workshop on Natural Language Processing Advancements for …, 2020 | | 2020 |
A Report on the First Workshop on Natural Language Processing Advancements for Software Engineering (NLPaSE) co-located with APSEC 2020 S Tiwaria, SS Rathoreb, L Nautiyalc, R Singhd | | 2020 |
2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS)| 978-1-6654-7704-8/22/$31.00© 2022 IEEE| DOI: 10.1109/QRS57517. 2022.00118 R Abreu, B Afshinpour, S Akiyama, OI Al-Bataineh, SC Allala, P Almeida, ... | | |
2022 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)| 978-1-6654-7679-9/22/$31.00© 2022 IEEE| DOI: 10.1109/ISSREW55968. 2022.00099 R Abreu, B Afshinpour, R Aghazadeh Chakherlou, A Aguiar, ME Ahmed, ... | | |