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Chang-Yeon Kim
Chang-Yeon Kim
Verified email at kbsi.re.kr
Title
Cited by
Cited by
Year
Crystal and electronic facet analysis of ultrafine Ni2P particles by solid-state NMR nanocrystallography
W Papawassiliou, JP Carvalho, N Panopoulos, Y Al Wahedi, VKS Wadi, ...
Nature Communications 12 (1), 4334, 2021
242021
Direct observation of the crystal structure changes in the MgxZn1− xO alloy system
SJ Yoo, JH Lee, CY Kim, CH Kim, JW Shin, HS Kim, JG Kim
Thin Solid Films 588, 50-55, 2015
52015
Circular Fast Fourier Transform Application: A Useful Script for Fast Fourier Transform Data Analysis of High-resolution Transmission Electron Microscopy Image
JG Kim, SJ Yoo, CY Kim, HT Jou
Applied Microscopy 44 (4), 138-143, 2014
32014
Migration and roughening of Σ3 {1 1 2} incoherent twin boundary in an Au nanocrystalline film
SB Lee, SJ Yoo, K Choi, JY Byun, CY Kim
Materials Characterization 159, 110063, 2020
22020
Detection of Weyl fermions and the metal to Weyl-semimetal phase transition in via broadband high resolution NMR
W Papawassiliou, JP Carvalho, HJ Kim, CY Kim, SJ Yoo, JB Lee, ...
Physical Review Research 4 (3), 033133, 2022
12022
Characterization of crystallographic properties of GaN thin film using automated crystal orientation mapping with TEM
SJ Yoo, JG Kim, CY Kim, EM Kim, JH Lee, YM Kim, SJ Yoo, SB Kim, ...
Metals and Materials International 18 (6), 997-1001, 2012
12012
Emergent Weyl fermions in WTe2 probed with Electron-States-Resolved NMR crystallography
W Papawassiliou, JP Carvalho, HJ Kim, CY Kim, SJ Yoo, JB Lee, ...
arXiv e-prints, arXiv: 2110.01300, 2021
2021
Three-Dimensional Automated Crystal Orientation and Phase Mapping Analysis of Epitaxially Grown Thin Film Interfaces by Using Transmission Electron Microscopy
CY Kim, JH Lee, SJ Yoo, SH Lee, JG Kim
Applied Microscopy 45 (3), 183-188, 2015
2015
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Articles 1–8