Charge pump with perfect current matching characteristics in phase-locked loops JS Lee, MS Keel, SI Lim, S Kim Electronics letters 36 (23), 1907-1908, 2000 | 365 | 2000 |
An energy-efficient VLSI architecture for pattern recognition via deep embedding of computation in SRAM M Kang, MS Keel, NR Shanbhag, S Eilert, K Curewitz 2014 IEEE International Conference on Acoustics, Speech and Signal …, 2014 | 197 | 2014 |
An energy-efficient memory-based high-throughput VLSI architecture for convolutional networks M Kang, SK Gonugondla, MS Keel, NR Shanbhag 2015 IEEE International Conference on Acoustics, Speech and Signal …, 2015 | 48 | 2015 |
A VGA Indirect Time-of-Flight CMOS Image Sensor With 4-Tap 7- m Global-Shutter Pixel and Fixed-Pattern Phase Noise Self-Compensation MS Keel, YG Jin, Y Kim, D Kim, Y Kim, M Bae, B Chung, S Son, H Kim, ... IEEE Journal of Solid-State Circuits 55 (4), 889-897, 2019 | 45 | 2019 |
Compute memory N Shanbhag, MG Kang, MS Keel US Patent 9,697,877, 2017 | 45 | 2017 |
Energy-efficient and high throughput sparse distributed memory architecture M Kang, EP Kim, M Keel, NR Shanbhag 2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2505-2508, 2015 | 39 | 2015 |
7.1 A 4-tap 3.5 μm 1.2 Mpixel indirect time-of-flight CMOS image sensor with peak current mitigation and multi-user interference cancellation MS Keel, D Kim, Y Kim, M Bae, M Ki, B Chung, S Son, H Lee, H Jo, ... 2021 IEEE International Solid-State Circuits Conference (ISSCC) 64, 106-108, 2021 | 31 | 2021 |
A 640× 480 indirect time-of-flight CMOS image sensor with 4-tap 7-μm global-shutter pixel and fixed-pattern phase noise self-compensation scheme MS Keel, YG Jin, Y Kim, D Kim, Y Kim, M Bae, B Chung, S Son, H Kim, ... 2019 Symposium on VLSI Circuits, C258-C259, 2019 | 24 | 2019 |
Custom test chip for system-level ESD investigations N Thomson, Y Xiu, R Mertens, MS Keel, E Rosenbaum Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014, 1-10, 2014 | 24 | 2014 |
A study of BER-optimal ADC-based receiver for serial links Y Lin, MS Keel, A Faust, A Xu, NR Shanbhag, E Rosenbaum, AC Singer IEEE Transactions on Circuits and Systems I: Regular Papers 63 (5), 693-704, 2016 | 16 | 2016 |
A 1.2-Mpixel Indirect Time-of-Flight Image Sensor With 4-Tap 3.5-μm Pixels for Peak Current Mitigation and Multi-User Interference Cancellation MS Keel, D Kim, Y Kim, M Bae, M Ki, B Chung, S Son, H Lee, SC Shin, ... IEEE Journal of Solid-State Circuits 56 (11), 3209-3219, 2021 | 15 | 2021 |
Correlated double sampling circuit MS Keel, KH Lee US Patent 7,919,993, 2011 | 15 | 2011 |
A 2.8 μm pixel for time of flight CMOS image sensor with 20 ke-full-well capacity in a tap and 36% quantum efficiency at 940 nm wavelength Y Kwon, S Seo, S Cho, SH Choi, T Hwang, Y Kim, YG Jin, Y Oh, MS Keel, ... 2020 IEEE International Electron Devices Meeting (IEDM), 33.2. 1-33.2. 4, 2020 | 13 | 2020 |
A 4-tap global shutter pixel with enhanced IR sensitivity for VGA time-of-flight CMOS image sensors T Jung, Y Kwon, S Seo, MS Keel, C Lee, SH Choi, SY Kim, S Cho, Y Kim, ... Electronic Imaging 32, 1-6, 2020 | 12 | 2020 |
ESD protection networks for 3D integrated circuits E Rosenbaum, V Shukla, MS Keel 2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE …, 2012 | 12 | 2012 |
CMOS delta-sigma frequency synthesizer with a new frequency divider and a simplified MASH structure SH Kim, MS Keel, KW Lee, SK Kim, SI Lim Journal of the Korean Physical Society 41 (6), 967, 2002 | 10 | 2002 |
CDM-reliable T-coil techniques for a 25-Gb/s wireline receiver front-end MS Keel, E Rosenbaum IEEE Transactions on Device and Materials Reliability 16 (4), 513-520, 2016 | 9 | 2016 |
CDM-reliable T-coil techniques for high-speed wireline receivers MS Keel, E Rosenbaum 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD …, 2015 | 9 | 2015 |
A 140 dB single-exposure dynamic-range CMOS image sensor with in-Pixel DRAM capacitor Y Oh, J Lim, S Park, D Yoo, M Lim, J Park, S Kim, M Jung, S Kim, J Lee, ... 2022 International Electron Devices Meeting (IEDM), 37.7. 1-37.7. 4, 2022 | 8 | 2022 |
Time of flight sensor, a three-dimensional imaging device using the same, and a method for driving the three-dimensional imaging device MS Keel, G Bitan, A Eisenberg US Patent 11,378,690, 2022 | 8 | 2022 |