Follow
Min-Sun Keel
Title
Cited by
Cited by
Year
Charge pump with perfect current matching characteristics in phase-locked loops
JS Lee, MS Keel, SI Lim, S Kim
Electronics letters 36 (23), 1907-1908, 2000
3652000
An energy-efficient VLSI architecture for pattern recognition via deep embedding of computation in SRAM
M Kang, MS Keel, NR Shanbhag, S Eilert, K Curewitz
2014 IEEE International Conference on Acoustics, Speech and Signal …, 2014
1972014
An energy-efficient memory-based high-throughput VLSI architecture for convolutional networks
M Kang, SK Gonugondla, MS Keel, NR Shanbhag
2015 IEEE International Conference on Acoustics, Speech and Signal …, 2015
482015
A VGA Indirect Time-of-Flight CMOS Image Sensor With 4-Tap 7- m Global-Shutter Pixel and Fixed-Pattern Phase Noise Self-Compensation
MS Keel, YG Jin, Y Kim, D Kim, Y Kim, M Bae, B Chung, S Son, H Kim, ...
IEEE Journal of Solid-State Circuits 55 (4), 889-897, 2019
452019
Compute memory
N Shanbhag, MG Kang, MS Keel
US Patent 9,697,877, 2017
452017
Energy-efficient and high throughput sparse distributed memory architecture
M Kang, EP Kim, M Keel, NR Shanbhag
2015 IEEE International Symposium on Circuits and Systems (ISCAS), 2505-2508, 2015
392015
7.1 A 4-tap 3.5 μm 1.2 Mpixel indirect time-of-flight CMOS image sensor with peak current mitigation and multi-user interference cancellation
MS Keel, D Kim, Y Kim, M Bae, M Ki, B Chung, S Son, H Lee, H Jo, ...
2021 IEEE International Solid-State Circuits Conference (ISSCC) 64, 106-108, 2021
312021
A 640× 480 indirect time-of-flight CMOS image sensor with 4-tap 7-μm global-shutter pixel and fixed-pattern phase noise self-compensation scheme
MS Keel, YG Jin, Y Kim, D Kim, Y Kim, M Bae, B Chung, S Son, H Kim, ...
2019 Symposium on VLSI Circuits, C258-C259, 2019
242019
Custom test chip for system-level ESD investigations
N Thomson, Y Xiu, R Mertens, MS Keel, E Rosenbaum
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014, 1-10, 2014
242014
A study of BER-optimal ADC-based receiver for serial links
Y Lin, MS Keel, A Faust, A Xu, NR Shanbhag, E Rosenbaum, AC Singer
IEEE Transactions on Circuits and Systems I: Regular Papers 63 (5), 693-704, 2016
162016
A 1.2-Mpixel Indirect Time-of-Flight Image Sensor With 4-Tap 3.5-μm Pixels for Peak Current Mitigation and Multi-User Interference Cancellation
MS Keel, D Kim, Y Kim, M Bae, M Ki, B Chung, S Son, H Lee, SC Shin, ...
IEEE Journal of Solid-State Circuits 56 (11), 3209-3219, 2021
152021
Correlated double sampling circuit
MS Keel, KH Lee
US Patent 7,919,993, 2011
152011
A 2.8 μm pixel for time of flight CMOS image sensor with 20 ke-full-well capacity in a tap and 36% quantum efficiency at 940 nm wavelength
Y Kwon, S Seo, S Cho, SH Choi, T Hwang, Y Kim, YG Jin, Y Oh, MS Keel, ...
2020 IEEE International Electron Devices Meeting (IEDM), 33.2. 1-33.2. 4, 2020
132020
A 4-tap global shutter pixel with enhanced IR sensitivity for VGA time-of-flight CMOS image sensors
T Jung, Y Kwon, S Seo, MS Keel, C Lee, SH Choi, SY Kim, S Cho, Y Kim, ...
Electronic Imaging 32, 1-6, 2020
122020
ESD protection networks for 3D integrated circuits
E Rosenbaum, V Shukla, MS Keel
2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE …, 2012
122012
CMOS delta-sigma frequency synthesizer with a new frequency divider and a simplified MASH structure
SH Kim, MS Keel, KW Lee, SK Kim, SI Lim
Journal of the Korean Physical Society 41 (6), 967, 2002
102002
CDM-reliable T-coil techniques for a 25-Gb/s wireline receiver front-end
MS Keel, E Rosenbaum
IEEE Transactions on Device and Materials Reliability 16 (4), 513-520, 2016
92016
CDM-reliable T-coil techniques for high-speed wireline receivers
MS Keel, E Rosenbaum
2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD …, 2015
92015
A 140 dB single-exposure dynamic-range CMOS image sensor with in-Pixel DRAM capacitor
Y Oh, J Lim, S Park, D Yoo, M Lim, J Park, S Kim, M Jung, S Kim, J Lee, ...
2022 International Electron Devices Meeting (IEDM), 37.7. 1-37.7. 4, 2022
82022
Time of flight sensor, a three-dimensional imaging device using the same, and a method for driving the three-dimensional imaging device
MS Keel, G Bitan, A Eisenberg
US Patent 11,378,690, 2022
82022
The system can't perform the operation now. Try again later.
Articles 1–20