| iFill: An impact-oriented X-filling method for shift-and capture-power reduction in at-speed scan-based testing J Li, Q Xu, Y Hu, X Li Proceedings of the conference on Design, automation and test in Europe, 1184 …, 2008 | 67 | 2008 |
| On capture power-aware test data compression for scan-based testing J Li, X Liu, Y Zhang, Y Hu, X Li, Q Xu 2008 IEEE/ACM International Conference on Computer-Aided Design, 67-72, 2008 | 45 | 2008 |
| X-filling for simultaneous shift-and capture-power reduction in at-speed scan-based testing J Li, Q Xu, Y Hu, X Li IEEE transactions on very large scale integration (VLSI) systems 18 (7 …, 2009 | 35 | 2009 |
| DfT optimization for pre-bond testing of 3D-SICs containing TSVs J Li, D Xiang 2010 IEEE International Conference on Computer Design, 474-479, 2010 | 26 | 2010 |
| On reducing both shift and capture power for scan-based testing J Li, Q Xu, Y Hu, X Li 2008 Asia and South Pacific Design Automation Conference, 653-658, 2008 | 19 | 2008 |
| A scan chain adjustment technology for test power reduction LI Jia, HU Yu, LI Xiaowei 2006 15th Asian Test Symposium, 11-16, 2006 | 19 | 2006 |
| Channel width utilization improvement in testing NoC-based systems for test time reduction J Li, Q Xu, Y Hu, X Li 4th IEEE International Symposium on Electronic Design, Test and Applications …, 2008 | 10 | 2008 |
| 体系结构级功耗分析方法 李佳， 徐勇军， 李晓维， 王新平 系统仿真学报 16 (12), 2821-2824, 2004 | 6 | 2004 |
| Built-in self-calibration of CMOS-compatible thermopile sensor with on-chip electrical stimulus J Li, Z Huang, W Wang 2014 19th IEEE European Test Symposium (ETS), 1-6, 2014 | 4 | 2014 |
| Prediction of compression bound and optimization of compression architecture for linear decompression-based schemes J Li, Y Huang, D Xiang 29th VLSI Test Symposium, 297-302, 2011 | 4 | 2011 |
| Capture-power-aware test data compression using selective encoding J Li, X Liu, Y Zhang, Y Hu, X Li, Q Xu Integration 44 (3), 205-216, 2011 | 2 | 2011 |
| Compression-aware capture power reduction for at-speed testing J Li, Q Xu, D Xiang 16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011), 806-811, 2011 | 1 | 2011 |
| Impact-factor-guided x-filling for peak power reduction during test J Li, Y Hu, X Li TENCON 2007-2007 IEEE Region 10 Conference, 1-4, 2007 | 1 | 2007 |
| SCANGIN: 一种降低扫描测试中动态功耗的方法 李佳， 胡瑜， 李晓维， 王伟 计算机辅助设计与图形学学报 18 (9), 1391-1396, 2006 | 1 | 2006 |
| 一种通用从机同步串行接口电路的设计 徐中龙， 华竹平， 李佳， 王玮冰 电视技术 38 (7), 40-43, 2014 | | 2014 |
| Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based Compression Environment Z Chen, J Li, D Xiang, Y Huang 2011 Asian Test Symposium, 96-101, 2011 | | 2011 |
| Scan chain design for shift power reduction in scan-based testing J Li, Y Hu, XW Li Science China Information Sciences 54, 767-777, 2011 | | 2011 |
| Test cost efficiency exploration for CMT processors J Li, Y Hu, X Li TENCON 2007-2007 IEEE Region 10 Conference, 1-4, 2007 | | 2007 |
