| Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature GH Major, TG Avval, B Moeini, G Pinto, D Shah, V Jain, V Carver, ... Journal of Vacuum Science & Technology A 38 (6), 2020 | 119 | 2020 |
| Definition of a new (Doniach‐Sunjic‐Shirley) peak shape for fitting asymmetric signals applied to reduced graphene oxide/graphene oxide XPS spectra B Moeini, MR Linford, N Fairley, A Barlow, P Cumpson, D Morgan, ... Surface and Interface Analysis, 2021 | 38 | 2021 |
| Box plots: A simple graphical tool for visualizing overfitting in peak fitting as demonstrated with X-ray photoelectron spectroscopy data B Moeini, H Haack, N Fairley, V Fernandez, TR Gengenbach, CD Easton, ... Journal of Electron Spectroscopy and Related Phenomena 250, 147094, 2021 | 22 | 2021 |
| The often-overlooked power of summary statistics in exploratory data analysis: comparison of pattern recognition entropy (PRE) to other summary statistics and introduction of … TG Avval, B Moeini, V Carver, N Fairley, EF Smith, J Baltrusaitis, ... Journal of chemical information and modeling 61 (9), 4173-4189, 2021 | 10 | 2021 |
| Surface Analysis Insight Note. Principal Component Analysis (PCA) of an X‐ray Photoelectron Spectroscopy Image. The Importance of Preprocessing. B Moeini, TG Avval, N Gallagher, MR Linford Surface and Interface Analysis, 2023 | 8 | 2023 |
| Surface Analysis Insight Note: Initial, Statistical Evaluation of X‐ray Photoelectron Spectroscopy Images B Moeini, MR Linford Surface and Interface Analysis, 2023 | 6 | 2023 |
| Surface-orientated platinum nanoparticles electrodeposited on a carbon substrate as a high performance electrocatalyst for glucose oxidation reaction in alkaline media B Moeini, TG Avval, MR Linford, M Ghalkhani, M Kaykhaii, RA Mirzaie Materials Science and Engineering: B 268, 115147, 2021 | 6 | 2021 |
| Surface Analysis Insight Note: Analysis of X‐ray Photoelectron Spectroscopy Images with Summary Statistics B Moeini, MR Linford Surface and Interface Analysis, 2023 | 4 | 2023 |
| A Nickel Sublayer: An Improvement in the Electrochemical Performance of Platinum-Based Electrocatalysts as Anodes in Glucose Alkaline Fuel Cells B Moeini, M Ghalkhani, T G Avval, M R Linford, R Abdullah Mirzaie Iranian Journal of Catalysis 11 (1), 77-87, 2021 | 3 | 2021 |
| Plotting XPS Narrow Scans (and Other data) with MATLAB, 1. Using the'plot'and'subplot'functions. TG Avval, GH Major, B Moein, MH Engelhard, MR Linford Vacuum Technology & Coating 20 (PNNL-SA-148773), 2019 | 3 | 2019 |
| Microstructure quantification of oblique angle sputtered porous a-Si thin films as a basis for structure-property relations of solid phase microextraction coatings Behnam Moeini, David T. Fullwood, Paul Minson, Daniel Shollenberger, David S ... Surface and Coatings Technology, 130014, 2023 | 2 | 2023 |
| Controlling the Surface Silanol Density in Capillary Columns and Planar Silicon via the Self-Limiting, Gas-Phase Deposition of Tris (dimethylamino) methylsilane, and … B Moeini, JW Pinder, TG Avval, C Jacobsen, HH Brongersma, S Prusa, ... Journal of Chromatography A, 464248, 2023 | 2 | 2023 |
| Study of Type of Electrolyte Effect on Platinum Electro-catalyst Performance Prepared by cyclic Voltammetry Electrodeposition Method for Glucose Oxidation Reaction RA Mirzaie, B Moeini MATTER: International Journal of Science and Technology 1 (1), 91-102, 2015 | 2 | 2015 |
| Surface analysis insight note: Multivariate curve resolution of an X‐ray photoelectron spectroscopy image B Moeini, N Gallagher, MR Linford Surface and Interface Analysis, 2023 | 1 | 2023 |
| Spectroscopic Ellipsometry of Transparent Uniaxially Anisotropic Thin Films B Moeini, TG Avval, G Pinto, JN Hilfiker, MR Linford Vacuum Technology & Coating, 2020 | 1 | 2020 |
| Plotting XPS Narrow Scans (and other Data) with MATLAB’s Powerful Plotting Capabilities, 2. An Introduction to Handle Graphics TG Avval, B Moeini, GH Major, MH Engelhard, MR Linford Vacuum Technology & Coating 20 (PNNL-SA-151236), 2019 | 1 | 2019 |
| Surface analysis insight note: An example of a cluster analysis of spectra from an X‐ray photoelectron spectroscopy image B Moeini, JM Linford, N Gallagher, MR Linford Surface and Interface Analysis 56 (2), 73-81, 2024 | | 2024 |
| Exploring Surface Silanization and Characterization of Thin Films: From Surface Passivation to Microstructural Characterization of Porous Silicon/Silica, and Exploratory Data … B Moeini Brigham Young University, 2023 | | 2023 |
| Area-Selective Atomic Layer Deposition of ZnO on Si\SiO2 Modified with Tris(dimethylamino)methylsilane B Moeini, TG Avval, HH Brongersma, S Průša, P Bábík, E Vaníčková, ... Materials 16 (13), 4688, 2023 | | 2023 |
| Area-Selective (Inhibited) Atomic Layer Deposition of ZnO on Si/SiO2 Using Tris (trimethylamino) methylsilane B Moeini, T Avval, H Brongersma, S Průša, P Bábík, E Vaníčková, ... Preprints, 2023 | | 2023 |
