| Noise model of gate-leakage current in ultrathin oxide MOSFETs J Lee, G Bosman, KR Green, D Ladwig IEEE Transactions on Electron Devices 50 (12), 2499-2506, 2003 | 70 | 2003 |
| Model and analysis of gate leakage current in ultrathin nitrided oxide MOSFETs J Lee, G Bosman, KR Green, D Ladwig IEEE Transactions on Electron Devices 49 (7), 1232-1241, 2002 | 51 | 2002 |
| Comprehensive noise performance of ultrathin oxide MOSFETs at low frequencies J Lee, G Bosman Solid-State Electronics 48 (1), 61-71, 2004 | 30 | 2004 |
| Comprehensive studies on the carrier transporting property and photo-bias instability of sputtered zinc tin oxide thin film transistors HW Lee, BS Yang, YJ Kim, AY Hwang, S Oh, JH Lee, JK Jeong, HJ Kim IEEE Transactions on Electron Devices 61 (9), 3191-3198, 2014 | 21 | 2014 |
| Defect spectroscopy using 1/fγ noise of gate leakage current in ultrathin oxide MOSFETs J Lee, G Bosman Solid-State Electronics 47 (11), 1973-1981, 2003 | 12 | 2003 |
| 1/fγ DRAIN CURRENT NOISE MODEL IN ULTRATHIN OXIDE MOSFETS J LEE, G BOSMAN Fluctuation and Noise Letters 4 (02), L297-L307, 2004 | 8 | 2004 |
| Physics-guided neural modeling for low-dimensional thermoelectric module J Lee IEEE Electron Device Letters 40 (11), 1812-1815, 2019 | 5 | 2019 |
| Physics-informed neural network for high frequency noise performance in quasi-ballistic MOSFETs J Lee Electronics 10 (18), 2219, 2021 | 4 | 2021 |
| GATE LEAKAGE CURRENT NOISE IN ULTRA-THIN GATE OXIDE MOSFET'S JH Lee, G Bosman, KR Green, D Ladwig Noise In Physical Systems And 1/F Fluctuations: ICNF 2001, 165-168, 2001 | 4 | 2001 |
| Charge-based quantum correction noise model in nanoscale MOSFETs J Lee, D Hong Journal of Semiconductor Technology and Science 19 (1), 50-62, 2019 | 3 | 2019 |
| Correlation noise measurements and modeling of nanoscale MOSFETs J Lee, G Bosman Advanced Experimental Methods for Noise Research in Nanoscale Electronic …, 2005 | 3 | 2005 |
| Comprehensive compact noise modeling of nanoscale CMOS devices J Lee University of Florida, 2003 | 3 | 2003 |
| Unified Model of Shot Noise in the Tunneling Current in Sub-10 nm MOSFETs J Lee Nanomaterials 11 (10), 2759, 2021 | 2 | 2021 |
| Three-level buck converter utilizing a DAC-based flying capacitor voltage control technique JW So, HR Yang, SM Park, J Lee, BS Bae, KS Yoon Analog Integrated Circuits and Signal Processing 107, 273-280, 2021 | 2 | 2021 |
| Physics-informed machine learning model for bias temperature instability J Lee AIP Advances 11 (2), 2021 | 2 | 2021 |
| Development of TFT-LCD panel with reduced driver ICs SM Kim, JH Lee, HW Lee, JH Lee, KS Choi 한국정보디스플레이학회 International Meeting, 352-354, 2008 | 2 | 2008 |
| Low frequency noise modeling and SPICE Implementation of Nanoscale MOSFETs J Lee Journal of Semiconductor Technology and Science 21 (1), 39-48, 2021 | 1 | 2021 |
| Thermoelectric transport modeling based on neural computation J Lee IEEE Electron Device Letters 40 (4), 514-517, 2019 | 1 | 2019 |
| Advanced pixel structure for higher aperture ratio in TFT-LCD JH Kim, SY Noh, ST Kang, JH Lee, KS Choi 한국정보디스플레이학회 International Meeting, 17-19, 2008 | 1 | 2008 |
| Analysis of Recombination Dynamics in Solar Cells by Generation-Decay Time Maps J Lee IEEE Electron Device Letters 43 (11), 1957-1960, 2022 | | 2022 |
