| Recent advances in convolutional neural network acceleration Q Zhang, M Zhang, T Chen, Z Sun, Y Ma, B Yu Neurocomputing 323, 37-51, 2019 | 210 | 2019 |
| Layout decomposition for triple patterning lithography B Yu, K Yuan, D Ding, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 172 | 2015 |
| Provably secure camouflaging strategy for IC protection M Li, K Shamsi, T Meade, Z Zhao, B Yu, Y Jin, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 148 | 2017 |
| Design for manufacturing with emerging nanolithography DZ Pan, B Yu, JR Gao IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013 | 100 | 2013 |
| Layout hotspot detection with feature tensor generation and deep biased learning H Yang, J Su, Y Zou, Y Ma, B Yu, EFY Young IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018 | 98 | 2018 |
| EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation D Ding, B Yu, J Ghosh, DZ Pan 17th Asia and South Pacific Design Automation Conference, 263-270, 2012 | 89 | 2012 |
| Imbalance aware lithography hotspot detection: a deep learning approach H Yang, L Luo, J Su, C Lin, B Yu Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (3), 033504, 2017 | 81 | 2017 |
| GAN-OPC: Mask optimization with lithography-guided generative adversarial nets H Yang, S Li, Z Deng, Y Ma, B Yu, EFY Young IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019 | 79 | 2019 |
| A new lithography hotspot detection framework based on AdaBoost classifier and simplified feature extraction T Matsunawa, JR Gao, B Yu, DZ Pan Design-Process-Technology Co-optimization for Manufacturability IX 9427, 201-211, 2015 | 78 | 2015 |
| Methodology for standard cell compliance and detailed placement for triple patterning lithography B Yu, X Xu, JR Gao, Y Lin, Z Li, CJ Alpert, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 76 | 2015 |
| Optical proximity correction with hierarchical bayes model T Matsunawa, B Yu, DZ Pan Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (2), 021009, 2016 | 75 | 2016 |
| Enabling online learning in lithography hotspot detection with information-theoretic feature optimization H Zhang, B Yu, EFY Young Proceedings of the 35th International Conference on Computer-Aided Design, 1-8, 2016 | 74 | 2016 |
| Self-aligned double patterning aware pin access and standard cell layout co-optimization X Xu, B Cline, G Yeric, B Yu, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 74 | 2015 |
| PARR: Pin-access planning and regular routing for self-aligned double patterning X Xu, B Yu, JR Gao, CL Hsu, DZ Pan ACM Transactions on Design Automation of Electronic Systems (TODAES) 21 (3 …, 2016 | 66 | 2016 |
| Deepbillboard: Systematic physical-world testing of autonomous driving systems H Zhou, W Li, Z Kong, J Guo, Y Zhang, B Yu, L Zhang, C Liu 2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE …, 2020 | 61 | 2020 |
| A high-performance triple patterning layout decomposer with balanced density B Yu, YH Lin, G Luk-Pat, D Ding, K Lucas, DZ Pan 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 163-169, 2013 | 61 | 2013 |
| Implications of triple patterning for 14nm node design and patterning K Lucas, C Cork, B Yu, G Luk-Pat, B Painter, DZ Pan Design for Manufacturability through Design-Process Integration VI 8327, 11-22, 2012 | 56 | 2012 |
| MrDP: Multiple-row detailed placement of heterogeneous-sized cells for advanced nodes Y Lin, B Yu, X Xu, JR Gao, N Viswanathan, WH Liu, Z Li, CJ Alpert, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 53 | 2017 |
| Machine Learning and Pattern Matching in Physical Design B Yu, DZ Pan, T Matsunawa, X Zeng IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), 2015 | 52 | 2015 |
| High performance graph convolutional networks with applications in testability analysis Y Ma, H Ren, B Khailany, H Sikka, L Luo, K Natarajan, B Yu ACM/IEEE Design Automation Conference (DAC), 1-6, 2019 | 50 | 2019 |
David Z. PanProfessor, Silicon Labs Endowed Chair, ECE Dept., University of Texas at AustinVerified email at ece.utexas.edu
