| Layout decomposition for triple patterning lithography B Yu, K Yuan, D Ding, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 169 | 2015 |
| Recent advances in convolutional neural network acceleration Q Zhang, M Zhang, T Chen, Z Sun, Y Ma, B Yu Neurocomputing 323, 37-51, 2019 | 144 | 2019 |
| Provably secure camouflaging strategy for IC protection M Li, K Shamsi, T Meade, Z Zhao, B Yu, Y Jin, DZ Pan IEEE transactions on computer-aided design of integrated circuits and …, 2017 | 135 | 2017 |
| Design for manufacturing with emerging nanolithography DZ Pan, B Yu, JR Gao IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013 | 94 | 2013 |
| Layout hotspot detection with feature tensor generation and deep biased learning H Yang, J Su, Y Zou, Y Ma, B Yu, EFY Young IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018 | 81 | 2018 |
| EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation D Ding, B Yu, J Ghosh, DZ Pan 17th Asia and South Pacific Design Automation Conference, 263-270, 2012 | 79 | 2012 |
| Methodology for standard cell compliance and detailed placement for triple patterning lithography B Yu, X Xu, JR Gao, Y Lin, Z Li, CJ Alpert, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 74 | 2015 |
| Self-aligned double patterning aware pin access and standard cell layout co-optimization X Xu, B Cline, G Yeric, B Yu, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 71 | 2015 |
| Imbalance aware lithography hotspot detection: a deep learning approach H Yang, L Luo, J Su, C Lin, B Yu Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (3), 033504, 2017 | 70 | 2017 |
| A new lithography hotspot detection framework based on AdaBoost classifier and simplified feature extraction T Matsunawa, JR Gao, B Yu, DZ Pan Design-Process-Technology Co-optimization for Manufacturability IX 9427, 94270S, 2015 | 67 | 2015 |
| Optical proximity correction with hierarchical bayes model T Matsunawa, B Yu, DZ Pan Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (2), 021009, 2016 | 65 | 2016 |
| Enabling online learning in lithography hotspot detection with information-theoretic feature optimization H Zhang, B Yu, EFY Young Proceedings of the 35th International Conference on Computer-Aided Design, 1-8, 2016 | 64 | 2016 |
| GAN-OPC: Mask optimization with lithography-guided generative adversarial nets H Yang, S Li, Z Deng, Y Ma, B Yu, EFY Young IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019 | 63 | 2019 |
| PARR: Pin-access planning and regular routing for self-aligned double patterning X Xu, B Yu, JR Gao, CL Hsu, DZ Pan ACM Transactions on Design Automation of Electronic Systems (TODAES) 21 (3 …, 2016 | 60 | 2016 |
| A high-performance triple patterning layout decomposer with balanced density B Yu, YH Lin, G Luk-Pat, D Ding, K Lucas, DZ Pan 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 163-169, 2013 | 60 | 2013 |
| Implications of triple patterning for 14nm node design and patterning K Lucas, C Cork, B Yu, G Luk-Pat, B Painter, DZ Pan Design for Manufacturability through Design-Process Integration VI 8327, 832703, 2012 | 55 | 2012 |
| MrDP: Multiple-row detailed placement of heterogeneous-sized cells for advanced nodes Y Lin, B Yu, X Xu, JR Gao, N Viswanathan, WH Liu, Z Li, CJ Alpert, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 49 | 2017 |
| Standard cell layout regularity and pin access optimization considering middle-of-line W Ye, B Yu, DZO Pan, YC Ban, L Liebmann Proceedings of the 25th edition on Great Lakes Symposium on VLSI, 289-294, 2015 | 48 | 2015 |
| Machine Learning and Pattern Matching in Physical Design B Yu, DZ Pan, T Matsunawa, X Zeng IEEE/ACM Asian and South Pacific Design Automation Conference (ASPDAC), 2015 | 48 | 2015 |
| TRIAD: A triple patterning lithography aware detailed router YH Lin, B Yu, DZ Pan, YL Li Proceedings of the International Conference on Computer-Aided Design, 123-129, 2012 | 48 | 2012 |
David Z. PanProfessor, Silicon Labs Endowed Chair, ECE Dept., University of Texas at AustinVerified email at ece.utexas.edu
