Modeling and predicting transistor aging under workload dependency using machine learning PR Genssler, HE Barkam, K Pandaram, M Imani, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers, 2023 | 12 | 2023 |
Fault diagnosis of linear analog electronic circuit based on natural response specification using K-NN algorithm K Pandaram, S Rathnapriya, V Manikandan Journal of Electronic Testing 37, 83-96, 2021 | 11 | 2021 |
WaSSaBi: Wafer Selection With Self-Supervised Representations and Brain-Inspired Active Learning K Pandaram, PR Genssler, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers, 2024 | 1 | 2024 |
Automated Deformation Detection System for Tubes and Rods in Manufacturing Industries Using Quasi Digital Sensors K Pandaram, V Manikandan, S Ramesh, M Sivaramakrishna 2019 9th IEEE International Conference on Control System, Computing and …, 2019 | 1 | 2019 |