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Seunghwan Kim
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Schottky Barrier Height Engineering for Electrical Contacts of Multilayered MoS2 Transistors with Reduction of Metal-Induced Gap States
GS Kim, SH Kim, J Park, KH Han, J Kim, HY Yu
ACS nano 12 (6), 6292-6300, 2018
1522018
Infrared Detectable MoS2 Phototransistor and Its Application to Artificial Multilevel Optic-Neural Synapse
SG Kim, SH Kim, J Park, GS Kim, JH Park, KC Saraswat, J Kim, HY Yu
ACS nano 13 (9), 10294-10300, 2019
992019
Effective Schottky Barrier Height Lowering of Metal/n-Ge with a TiO2/GeO2 Interlayer Stack
GS Kim, SW Kim, SH Kim, J Park, Y Seo, BJ Cho, C Shin, JH Shim, HY Yu
ACS Applied Materials & Interfaces 8 (51), 35419-35425, 2016
412016
Specific Contact Resistivity Reduction Through Ar Plasma-Treated TiO2−xInterfacial Layer to Metal/Ge Contact
GS Kim, JK Kim, SH Kim, J Jo, C Shin, JH Park, KC Saraswat, HY Yu
IEEE Electron Device Letters 35 (11), 1076-1078, 2014
412014
Hysteresis modulation on van der Waals‐based ferroelectric field‐effect transistor by interfacial passivation technique and its application in optic neural networks
H Jeon, SG Kim, J Park, SH Kim, E Park, J Kim, HY Yu
Small 16 (49), 2004371, 2020
342020
Nitrogen-induced filament confinement technique for a highly reliable hafnium-based electrochemical metallization threshold switch and its application to flexible logic circuits
JH Park, SH Kim, SG Kim, K Heo, HY Yu
ACS applied materials & interfaces 11 (9), 9182-9189, 2019
322019
Surface Passivation of Germanium Using SF6Plasma to Reduce Source/Drain Contact Resistance in Germanium n-FET
GS Kim, SH Kim, JK Kim, C Shin, JH Park, KC Saraswat, BJ Cho, HY Yu
IEEE Electron Device Letters 36 (8), 745-747, 2015
302015
The effect of interfacial dipoles on the metal-double interlayers-semiconductor structure and their application in contact resistivity reduction
SW Kim, SH Kim, GS Kim, C Choi, R Choi, HY Yu
ACS Applied Materials & Interfaces 8 (51), 35614-35620, 2016
272016
Improved switching characteristics of p-type tin monoxide field-effect transistors through Schottky energy barrier engineering
T Kim, JK Kim, B Yoo, H Xu, S Yim, SH Kim, HY Yu, JK Jeong
Journal of Materials Chemistry C 8 (1), 201-208, 2020
232020
Schottky Barrier Height Modulation Using Interface Characteristics of MoS2 Interlayer for Contact Structure
SH Kim, KH Han, GS Kim, SG Kim, J Kim, HY Yu
ACS applied materials & interfaces 11 (6), 6230-6237, 2019
192019
Fermi-level unpinning using a Ge-passivated metal–interlayer–semiconductor structure for non-alloyed ohmic contact of high-electron-mobility transistors
SH Kim, GS Kim, JK Kim, JH Park, C Shin, C Choi, HY Yu
IEEE Electron Device Letters 36 (9), 884-886, 2015
172015
An artificial neuron using a bipolar electrochemical metallization switch and its enhanced spiking properties through filament confinement
T Kim*, SH Kim*, JH Park, J Park, E Park, SG Kim, HY Yu
Advanced Electronic Materials 7 (1), 2000410, 2021
162021
Effect of hydrogen annealing on contact resistance reduction of metal–interlayer–n-germanium source/drain structure
GS Kim, G Yoo, Y Seo, SH Kim, K Cho, BJ Cho, C Shin, JH Park, HY Yu
IEEE Electron Device Letters 37 (6), 709-712, 2016
162016
Enhancement of Synaptic Characteristics Achieved by the Optimization of Proton–Electron Coupling Effect in a Solid‐State Electrolyte‐Gated Transistor
DG Jin, SH Kim, SG Kim, J Park, E Park, HY Yu
Small 17 (30), 2100242, 2021
152021
Fermi-level unpinning technique with excellent thermal stability for n-type germanium
GS Kim, SH Kim, TI Lee, BJ Cho, C Choi, C Shin, JH Shim, J Kim, HY Yu
ACS applied materials & interfaces 9 (41), 35988-35997, 2017
152017
Non-Alloyed Ohmic Contacts on GaAs Using Metal-Interlayer-Semiconductor Structure With SF6 Plasma Treatment
SH Kim, GS Kim, SW Kim, JK Kim, C Choi, JH Park, R Choi, HY Yu
IEEE Electron Device Letters 37 (4), 373-376, 2016
142016
Steep‐Slope Gate‐Connected Atomic Threshold Switching Field‐Effect Transistor with MoS2 Channel and Its Application to Infrared Detectable Phototransistors
SG Kim, SH Kim, GS Kim, H Jeon, T Kim, HY Yu
Advanced Science 8 (12), 2100208, 2021
122021
Nondegenerate n-type doping phenomenon on molybdenum disulfide (MoS2) by zinc oxide (ZnO)
DH Kang, ST Hong, A Oh, SH Kim, HY Yu, JH Park
Materials Research Bulletin 82, 26-30, 2016
122016
Enhancement of DRAM performance by adopting metal–interlayer–semiconductor source/drain contact structure on DRAM cell
M Son, SG Jung, SH Kim, E Park, SH Lee, HY Yu
IEEE Transactions on Electron Devices 68 (5), 2275-2280, 2021
72021
Ultralow Schottky barrier height achieved by using molybdenum disulfide/dielectric stack for source/drain contact
SH Kim, KH Han, E Park, SG Kim, HY Yu
ACS applied materials & interfaces 11 (37), 34084-34090, 2019
72019
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