Follow
Patrick C. Deenen
Title
Cited by
Cited by
Year
Optimizing class-constrained wafer-to-order allocation in semiconductor back-end production
PC Deenen, J Adan, A Akcay
Journal of Manufacturing Systems 57, 72-81, 2020
62020
Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
PC Deenen, J Middelhuis, A Akcay, IJBF Adan
Flexible Services and Manufacturing Journal, 1-30, 2023
42023
Wafer-to-order allocation in semiconductor back-end production
PC Deenen, J Adan, J Stokkermans, IJBF Adan, A Akcay
2019 Winter Simulation Conference (WSC), 2360-2371, 2019
42019
Predicting cycle time distributions with aggregate modelling of work areas in a real-world wafer fab
PC Deenen, J Adan, JW Fowler
2021 Winter Simulation Conference (WSC), 1-12, 2021
12021
2023 Index IEEE Transactions on Semiconductor Manufacturing Vol. 36
SS Agashe, I Ahsan, A Akcay, II Akpabio, A Albeshri, C Anthony, ...
IEEE Transactions on Semiconductor Manufacturing 36 (4), 2023
2023
Data-driven modeling and optimization of semiconductor manufacturing
PC Deenen
2023
Scheduling a Real-World Photolithography Area With Constraint Programming
P Deenen, W Nuijten, A Akcay
IEEE Transactions on Semiconductor Manufacturing, 2023
2023
Building a Digital Twin of the Photolithography Area of A Real-World Wafer FAB To Validate Improved Production Control
PC Deenen, RAM Adriaensen, JW Fowler
2022 Winter Simulation Conference (WSC), 3394-3405, 2022
2022
Multi-objective optimization of a sorting system
A Smit, J Adan, PC Deenen
2020 Winter Simulation Conference (WSC), 1718-1729, 2020
2020
Optimizing production control in the lithography area of a semiconductor manufacturing facility
PC Deenen, J Driessen
Testing and developing optimal dispatching strategies in a simulated front-end semiconductor facility
PC Deenen, AE Akçay, WL van Jaarsveld
The system can't perform the operation now. Try again later.
Articles 1–11