| Evidence of interface trap build-up in irradiated 14-nm bulk FinFET technologies A Privat, HJ Barnaby, M Spear, M Esposito, JE Manuel, L Clark, ... IEEE Transactions on Nuclear Science 68 (5), 671-676, 2021 | 8 | 2021 |
| Layout dependence of total ionizing dose effects on 12-nm bulk FinFET core digital structures T Wallace, M Spear, A Privat, J Neuendank, G Irumva, D Wilson, ... IEEE Transactions on Nuclear Science 70 (4), 620-626, 2022 | 6 | 2022 |
| Single event upset and total ionizing dose response of 12LP FinFET digital circuits J Neuendank, M Spear, T Wallace, D Wilson, J Solano, G Irumva, ... 2022 IEEE Radiation Effects Data Workshop (REDW)(in conjunction with 2022 …, 2022 | 4 | 2022 |
| Non-linear coupling effects in fully depleted SOI transistors M Spear, HJ Barnaby, T Wallace, J Solano, O Forman, D Wilson, ... IEEE Transactions on Nuclear Science 70 (4), 434-441, 2023 | 3 | 2023 |
| The Impact of Analog-to-Digital Converter Architecture and Variability on Analog Neural Network Accuracy M Spear, JE Kim, CH Bennett, S Agarwal, MJ Marinella, TP Xiao IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2023 | 1 | 2023 |
| Radiation-induced Enhancement of Scattering Effects in FD-SOI MOSFETs M Spear, F Al Mamun, J Solano, HJ Barnaby, IS Esqueda 2022 22nd European Conference on Radiation and Its Effects on Components and …, 2022 | 1 | 2022 |
| Heavy-Ion-Induced Displacement Damage Effects on WOx ECRAM MJ Marinella, CH Bennett, B Zutter, M Siath, M Spear, G Vizkelethy, ... IEEE Transactions on Nuclear Science, 2024 | | 2024 |
| Statistical Characterization of ReRAM Arrays for Analog In-Memory Computing J Short, M Spear, D Wilson, W Wahby, TP Xiao, R Jacobs-Gedrim, ... 2023 IEEE International Conference on Rebooting Computing (ICRC), 1-5, 2023 | | 2023 |
| TID Effects on Random Telegraph Signals in Bulk 90 nm MOSFET Devices J Neuendank, F Al Mamun, H Barnaby, S Bonaldo, M Spear, T Wallace, ... 2023 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2023 | | 2023 |
| Analog Neural Network Inference Accuracy in One-Selector One-Resistor Memory Arrays JE Kim, TP Xiao, CH Bennett, D Wilson, M Spear, M Siath, B Feinberg, ... 2022 IEEE International Conference on Rebooting Computing (ICRC), 7-12, 2022 | | 2022 |
| TCAD Calibrated SEE Fault Model Validated with Beam Results for a 12nm D Flip-Flop. C YoungSciortino, J Neuendank, LT Clark, H Barnaby, D Wilson, M Spear, ... 2022 22nd European Conference on Radiation and Its Effects on Components and …, 2022 | | 2022 |
| Total Ionizing Dose Response of Commercial 22nm FD-SOI CMOS Technology J Solano, M Spear, T Wallace, D Wilson, O Forman, IS Esqueda, ... 2022 IEEE Radiation Effects Data Workshop (REDW)(in conjunction with 2022 …, 2022 | | 2022 |
| Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits. M Spear, T Wallace, D Wilson, J Solano, G Irumva, IS Esqueda, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States); Sandia …, 2022 | | 2022 |
| Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Digital Structures. T Wallace, M Spear, A Privat, J Neuendank, G Irumva, D Wilson, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States); Sandia …, 2022 | | 2022 |
| Total ionizing dose and single event effects on 12-nm bulk FinFETs. D Wilson, M Spear, T Wallace, G Irumva, J Neuendank, I Sanchez, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2022 | | 2022 |
| Characterization of Total Ionixing Dose Effects in 12nm FinFET Technology with 60keV X-Rays. M Spear, H Barnaby, J Neuendank, T Wallace Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2022 | | 2022 |
| Optimal Design of an N+ 1 Narrow-Body Transport Aircraft H Halversen, R Mitchell, M Spear, B Vo, TT Takahashi AIAA Scitech 2020 Forum, 0270, 2020 | | 2020 |
| Tables of RADECS 2022 Papers L Coïc, G Augustin, L Serrano, J Guillermin, N Chatry, J Carron, R Ecoffet, ... | | |
