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Simona Borrelli
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Generation and measurement of sub-micrometer relativistic electron beams
S Borrelli, GL Orlandi, M Bednarzik, C David, E Ferrari, VA Guzenko, ...
Communications Physics 1 (1), 52, 2018
192018
The ACHIP experimental chambers at the Paul Scherrer Institut
E Ferrari, R Ischebeck, M Bednarzik, S Bettoni, S Borrelli, HH Braun, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2018
142018
Feasibility of a pulsed ponderomotive phase plate for electron beams
KAH van Leeuwen, WJ Schaap, B Buijsse, S Borrelli, ST Kempers, ...
New Journal of Physics 25 (2), 023031, 2023
62023
First experimental results of the commissioning of the SwissFEL wire-scanners
GL Orlandi, A Alarcon, S Borrelli, A Gobbo, P Heimgartner, R Ischebeck, ...
Proc. of Int. Beam Instrumentation Conf.(IBIC’17), Grand Rapids, Michigan …, 2017
32017
The ACHIP Experimental Chambers at PSI
E Ferrari, M Bednarzik, S Bettoni, S Borrelli, HH Braun, M Calvi, C David, ...
38th Int. Free Electron Laser Conf.(FEL'17), Santa Fe, NM, USA, August 20-25 …, 2018
22018
Direct observation of sub-Poissonian temporal statistics in a continuous free-electron beam with subpicosecond resolution
S Borrelli, TCH de Raadt, SB van der Geer, PHA Mutsaers, ...
Physical Review Letters 132 (11), 115001, 2024
12024
RF Cavity-based Ultrafast Transmission Electron Microscopy
S Borrelli, ST Kempers, PHA Mutsaers, OJ Luiten
12023
Photodiode-based time zero determination for ultrafast electron microscopy
ST Kempers, S Borrelli, ER Kieft, HA van Doorn, PHA Mutsaers, OJ Luiten
Structural Dynamics 10 (6), 2023
12023
Characterization of the electron beam in the ACHIP chamber in SwissFEL
R Ischebeck, S Bettoni, S Borrelli, M Calvi, P Dijkstal, E Ferrari, ...
Journal of Physics: Conference Series 1596 (1), 012019, 2020
12020
Wire scanner on a chip
S Borrelli, M Bednarzik, C David, E Ferrari, A Gobbo, VA Guzenko, ...
1
From SwissFEL wire scanners to the novel wire scanner on-a-chip: a resolution improvement
S BORRELLI
2021
FERMI-PSI COLLABORATION ON NANO-FABRICATED WIRE-SCANNERS WITH SUB-MICROMETER RESOLUTION: DEVELOPMENTS AND MEASUREMENTS
GL Orlandi, S Borrelli, C David, E Ferrari, V Guzenko, B Hermann, ...
8th International Beam Instrumentation Conference (IBIC'19), Malmö, Sweden …, 2019
2019
Wire-Scanners with Sub-Micrometer Resolution: Developments and Measurements
GL Orlandi, S Borrelli, C David, E Ferrari, V Guzenko, B Hermann, ...
39th Free Electron Laser Conference (FEL'19), Hamburg, Germany, 26-30 August …, 2019
2019
Commissioning Results and First Operational Experience with SwissFEL Diagnostics
V Schlott, V Arsov, M Baldinger, R Baldinger, G Bonderer, S Borelli, ...
6th Int. Beam Instrumentation Conf.(IBIC'17), Grand Rapids, MI, USA, 20-24 …, 2018
2018
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