| Generation and measurement of sub-micrometer relativistic electron beams S Borrelli, GL Orlandi, M Bednarzik, C David, E Ferrari, VA Guzenko, ... Communications Physics 1 (1), 52, 2018 | 19 | 2018 |
| The ACHIP experimental chambers at the Paul Scherrer Institut E Ferrari, R Ischebeck, M Bednarzik, S Bettoni, S Borrelli, HH Braun, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2018 | 14 | 2018 |
| Feasibility of a pulsed ponderomotive phase plate for electron beams KAH van Leeuwen, WJ Schaap, B Buijsse, S Borrelli, ST Kempers, ... New Journal of Physics 25 (2), 023031, 2023 | 6 | 2023 |
| The ACHIP Experimental Chambers at PSI E Ferrari, M Bednarzik, S Bettoni, S Borrelli, HH Braun, M Calvi, C David, ... 38th Int. Free Electron Laser Conf.(FEL'17), Santa Fe, NM, USA, August 20-25 …, 2018 | 2 | 2018 |
| First experimental results of the commissioning of the SwissFEL wire-scanners GL Orlandi, A Alarcon, S Borrelli, A Gobbo, P Heimgartner, R Ischebeck, ... Proc. of Int. Beam Instrumentation Conf.(IBIC’17), Grand Rapids, Michigan …, 2017 | 2 | 2017 |
| RF Cavity-based Ultrafast Transmission Electron Microscopy S Borrelli, ST Kempers, PHA Mutsaers, OJ Luiten | 1 | 2023 |
| Direct Observation of Sub-Poissonian Temporal Statistics in a Continuous Free Electron Beam with Sub-picosecond Resolution S Borrelli, TCH de Raadt, PHA Mutsaers, KAH van Leeuwen, OJ Luiten arXiv preprint arXiv:2310.09248, 2023 | 1 | 2023 |
| Characterization of the Electron Beam in the ACHIP Chamber in SwissFEL R Ischebeck, S Bettoni, S Borrelli, M Calvi, P Dijkstal, E Ferrari, ... Journal of Physics: Conference Series 1596 (1), 012019, 2020 | 1 | 2020 |
| Wire scanner on a chip S Borrelli, M Bednarzik, C David, E Ferrari, A Gobbo, VA Guzenko, ... | 1 | |
| Photodiode-based time zero determination for ultrafast electron microscopy ST Kempers, S Borrelli, ER Kieft, HA van Doorn, PHA Mutsaers, OJ Luiten Structural Dynamics 10 (6), 2023 | | 2023 |
| From SwissFEL wire scanners to the novel wire scanner on-a-chip: a resolution improvement S BORRELLI | | 2021 |
| Wire-Scanners with Sub-Micrometer Resolution: Developments and Measurements GL Orlandi, S Borrelli, C David, E Ferrari, V Guzenko, B Hermann, ... 39th Free Electron Laser Conference (FEL'19), Hamburg, Germany, 26-30 August …, 2019 | | 2019 |
| FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements GL Orlandi, S Borrelli, C David, E Ferrari, V Guzenko, B Hermann, ... | | 2019 |
| A Novel Nanotechnology Based Wire Scanner for Sub-Micrometer Resolution Measurements of the Electron Beam Profile at SwissFEL S Borrelli, M Bednarzik, C David, E Ferrari, A Gobbo, V Guzenko, N Hiller, ... | | 2018 |
| Commissioning Results and First Operational Experience with SwissFEL Diagnostics V Schlott, V Arsov, M Baldinger, R Baldinger, G Bonderer, S Borelli, ... 6th Int. Beam Instrumentation Conf.(IBIC'17), Grand Rapids, MI, USA, 20-24 …, 2018 | | 2018 |
Rasmus IschebeckElectron Beam Instrumentation Group, Paul Scherrer InstitutVerified email at psi.ch
