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Dren Qerimi
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Cited by
Year
Radical probe system for in situ measurements of radical densities of hydrogen, oxygen, and nitrogen
D Qerimi, I Shchelkanov, G Panici, A Jain, J Wagner, DN Ruzic
Journal of Vacuum Science & Technology A 39 (2), 2021
122021
Study of a linear surface wave plasma source for tin removal in an extreme ultraviolet source
D Qerimi, G Panici, A Jain, D Jacobson, DN Ruzic
Journal of Vacuum Science & Technology B 38 (5), 2020
112020
Study of Sn removal by surface wave plasma for source cleaning
G Panici, D Qerimi, DN Ruzic
Extreme Ultraviolet (EUV) Lithography VIII 10143, 522-529, 2017
62017
Tin removal by an annular surface wave plasma antenna in an extreme ultraviolet lithography source
D Qerimi, AC Herschberg, G Panici, P Hays, T Pohlman, DN Ruzic
Journal of Applied Physics 132 (11), 2022
52022
Determination of recombination coefficients for hydrogen, oxygen, and nitrogen gasses via in situ radical probe system
D Qerimi, G Panici, A Jain, D Jacobson, DN Ruzic
Journal of Vacuum Science & Technology A 39 (2), 2021
52021
Modeling Sn scattering through hydrogen using DFT potentials
J Stahl, D Qerimi, N Braaksma, P Mayer, D Brandt, DN Ruzic
Extreme Ultraviolet (EUV) Lithography XII 11609, 116091R, 2021
12021
Ongoing investigation of collector cleaning by surface wave plasma in the Illinois NXE: 3100 chamber
GA Panici, D Qerimi, DN Ruzic
Extreme Ultraviolet (EUV) Lithography X 10957, 109571B, 2019
12019
Study of Sn removal by surface wave plasma for source cleaning (Conference Presentation)
GA Panici, D Qerimi, DN Ruzic
Extreme Ultraviolet (EUV) Lithography IX 10583, 105831A, 2018
12018
Tin removal by annular surface wave plasma antenna in an extreme ultraviolet source
D Qerimi, AC Herschberg, P Hays, T Pohlman, DN Ruzic
Optical and EUV Nanolithography XXXV, PC120510Y, 2022
2022
Tin etching in an EUV source by inherent and surface wave plasma
D Qerimi
University of Illinois at Urbana-Champaign, 2022
2022
Single Electrode AC Plasma Anemometer in High Speed H2 Jet With Background RF Plasma
EH Matlis, TC Corke, D Qerimi, D Ruzic
AIAA AVIATION 2022 Forum, 3364, 2022
2022
Influence of temperature, hydrogen ions, and hydrogen radicals on Sn etching
D Qerimi, G Panici, J Stahl, F Li, N Braaksma, I Fomenkov, D Brandt, ...
Extreme Ultraviolet (EUV) Lithography XII 11609, 116091A, 2021
2021
Study of ion enhanced Sn removal by surface wave plasma for source cleaning (Conference Presentation)
DN Ruzic, GA Panici, D Qerimi
International Conference on Extreme Ultraviolet Lithography 2017 10450, 1045013, 2017
2017
Modeling Tin Scattering Through Hydrogen Using Density-Functional Theory
J Stahl, D Qerimi, N Braaksma, P Mayer, D Brandt, DN Ruzic
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Articles 1–14