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Co-authors
- Christopher H. T. LeeAssociate Professor, Nanyang Technological UniversityVerified email at eee.hku.hk
- Yuefei ZuoProfessor, Nanjing University of Aeronautics and AstronauticsVerified email at ieee.org
- Jiahao ChenShanghaiTech UniversityVerified email at shanghaitech.edu.cn
- Shuangchun XieNanyang Technological University, Ph.D, Research FellowVerified email at e.ntu.edu.sg
- Jie MeiMassachusetts Institute of TechnologyVerified email at mit.edu
- Giampaolo ButicchiProfessor in Electrical Engineering, University of Nottingham Ningbo China (UNNC)Verified email at nottingham.edu.cn
- Michele DeganoProfessor University of NottinghamVerified email at nottingham.ac.uk
- Jingwei ZhuThe Edward R. Felber Power Fellowship Scholar of University of Wisconsin-Madison, WEMPECVerified email at connect.polyu.hk
- C.Q. JiangAssistant Professor, City University of Hong KongVerified email at cityu.edu.hk
- Ying Fansoutheast universityVerified email at seu.edu.cn
- Libing CaoLecturer (Assistant Professor), Newcastle UniversityVerified email at ncl.ac.uk
- Giorgio ValenteRomax TechnologyVerified email at exmail.nottingham.ac.uk
- David GeradaProfessor, University of Nottingham, UKVerified email at nottingham.ac.uk
- Eraldo PreciUniversity of NottinghamVerified email at nottingham.ac.uk
- Wei LiuAssistant Professor, The Hong Kong Polytechnic UniversityVerified email at polyu.edu.hk
- Xiaoguang ZhangProfessor at the North China University of TechnologyVerified email at ncut.edu.cn
- Zhiqiang ZengNanyang Technological UniversityVerified email at ntu.edu.sg