A practical group blind signature scheme for privacy protection in smart grid W Kong, J Shen, P Vijayakumar, Y Cho, V Chang Journal of Parallel and Distributed Computing 136, 29-39, 2020 | 73 | 2020 |
Anti-synchronization and robust authentication for noisy PUF-based smart card Y Chen, W Kong, X Jiang IEEE Access 7, 142214-142223, 2019 | 7 | 2019 |
An Automatic Code Generation Method Based on Sequence Generative Adversarial Network H Sun, Y Nie, X Li, M Huang, J Tian, W Kong 2022 7th IEEE International Conference on Data Science in Cyberspace (DSC …, 2022 | 2 | 2022 |
Risk Scenario Generation for Autonomous Driving Systems based on Scenario Evaluation Model T Wang, X Kuang, H Deng, T Gu, W Kong, J Tian, G Zhao 2023 International Joint Conference on Neural Networks (IJCNN), 1-8, 2023 | 1 | 2023 |
Are Adversarial Examples Suitable To Be Test Suites for Testing Deep Neural Networks XK Wei Kong, Huayang Cao, Hu Li The Design Automation Conference (Post), 2024 | | 2024 |
A New Perspective of DL Testing Framework: Human-Computer Interaction Based Neural Network Testing XK Wei Kong, Hu Li, Qianjin Du, Huayang Cai 2024 IEEE International Conference on Robotics and Automation, 2024 | | 2024 |
Transcend Adversarial Examples: Diversified Adversarial Attacks to Test Deep Learning Model XK Wei Kong, Hu Li IEEE International Conference on Computer Design, 2023 | | 2023 |
Test Suite Generation Based on Context-Adapted Structural Coverage for Testing DNN W Kong, Q Du, H Cao, H Li, T Wang, J Tian, X Kuang 2023 24st Asia-Pacific Network Operations and Management Symposium (APNOMS), 1-6, 2023 | | 2023 |
Toward Testing Deep Learning Library via Model Fuzzing W Kong, H Cao, T Wang, Y Nie, H Li, Y Nie, X Kuang The Second Workshop on New Frontiers in Adversarial Machine Learning (ICML), 2023 | | 2023 |
Automated Software Vulnerability Detection via Curriculum Learning Q Du, W Kong, X Kuang, X Li, G Zhao 2023 IEEE International Conference on Multimedia and Expo (ICME), 2855-2860, 2023 | | 2023 |
Context-adaptive Automated Testing for Deep Learning Model K Wei, C Huayang, D Qianjin, T Jianwen, G TaoTao, K Xiaohui The ACM SIGSOFT International Symposium on Software Testing and Analysis …, 2023 | | 2023 |
Detecting Adversarial Samples in Neural Network with Statistical Metrics: A Practical Approach W Kong, H Cao, J Tian, X Kuang 2021 IEEE Sixth International Conference on Data Science in Cyberspace (DSC …, 2021 | | 2021 |
Detecting Adversarial Samples with Neuron Coverage H Cao, W Kong, X Kuang, J Tian 2021 IEEE International Conference on Computer Science, Artificial …, 2021 | | 2021 |
基于大数据的智慧图书馆系统框架与实现. 徐蕾, 孔伟 Experimental Technology & Management 37 (3), 2020 | | 2020 |