| Improved Current Density and Contact Resistance in Bilayer MoSe2 Field Effect Transistors by AlOx Capping D Somvanshi, E Ber, CS Bailey, E Pop, E Yalon ACS applied materials & interfaces 12 (32), 36355-36361, 2020 | 34 | 2020 |
| Measurement of the variable surface charge concentration in gallium nitride and implications on device modeling and physics E Ber, B Osman, D Ritter IEEE Transactions on Electron Devices 66 (5), 2100-2105, 2019 | 17 | 2019 |
| Uncovering the different components of contact resistance to atomically thin semiconductors E Ber, RW Grady, E Pop, E Yalon Advanced Electronic Materials 9 (6), 2201342, 2023 | 10 | 2023 |
| Joule-heating induced phase transition in 1T-TaS2 near room temperature probed by thermal imaging of power dissipation Y Jarach, L Rodes, E Ber, E Yalon, A Kanigel Applied Physics Letters 120 (8), 2022 | 4 | 2022 |
| Drift of Schottky barrier height in phase change materials RG Nir-Harwood, G Cohen, A Majumdar, R Haight, E Ber, L Gignac, ... ACS nano 18 (11), 8029-8037, 2024 | 2 | 2024 |
| Spontaneous Raman scattering from vibrational polaritons is obscured by reservoir states B Cohn, T Filippov, E Ber, L Chuntonov The Journal of Chemical Physics 159 (10), 2023 | 1 | 2023 |
| Exploring Charge Trapping Dynamics in Si: HfO₂-FeFETs by Temperature-Dependent Electrical Characterization MM Dahan, E Ber, O Levit, H Mulaosmanovic, S Dünkel, J Müller, S Beyer, ... 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
| High-Speed Electrical Transient Thermometry of Monolayer MoS2 E Ber, E Yalon 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
| Ionic–electronic dynamics in an electrochemical gate stack toward high-speed artificial synapses O Levit, E Ber, MM Dahan, Y Keller, E Yalon Applied Physics Letters 123 (21), 2023 | | 2023 |
| High Number of Transport Modes: A Requirement for Contact Resistance Reduction to Atomically Thin Semiconductors E Ber, RW Grady, E Pop, E Yalon IEEE Transactions on Electron Devices 70 (4), 1829-1834, 2023 | | 2023 |
