| How to control solid state dewetting: A short review F Leroy, F Cheynis, Y Almadori, S Curiotto, M Trautmann, JC Barbé, ... Surface Science Reports 71 (2), 391-409, 2016 | 212 | 2016 |
| Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy E Palleau, L Ressier, T Mélin Nanotechnology 21 (22), 225706, 2010 | 61 | 2010 |
| Calibrated work function mapping by Kelvin probe force microscopy PA Fernández Garrillo, B Grévin, N Chevalier, Ł Borowik Review of Scientific Instruments 89 (4), 2018 | 54 | 2018 |
| Measuring the lifetime of silicon nanocrystal solar cell photo-carriers by using Kelvin probe force microscopy and x-ray photoelectron spectroscopy H Lepage, N Chevalier, D Mariolle, O Renault Nanotechnology 25 (26), 265703, 2014 | 39 | 2014 |
| Photo-carrier multi-dynamical imaging at the nanometer scale in organic and inorganic solar cells PA Fernández Garrillo, Ł Borowik, F Caffy, R Demadrille, B Grévin ACS applied materials & interfaces 8 (45), 31460-31468, 2016 | 35 | 2016 |
| Calculating Kelvin force microscopy signals from static force fields Ł Borowik, K Kusiaku, D Théron, T Mélin Applied Physics Letters 96 (10), 2010 | 27 | 2010 |
| Method for making semi-conductor nanocrystals oriented along a predefined direction L Borowik, JC Barbe, E Bussmann, F Cheynis, F LeRoy, D Mariolle, ... US Patent 8,697,548, 2014 | 21 | 2014 |
| Method for making semi-conductor nanocrystals L Borowik, JC Barbe, E Bussmann, F Cheynis, F Leroy, D Mariolle, ... US Patent 8,647,957, 2014 | 21 | 2014 |
| Scanning Auger microscopy for high lateral and depth elemental sensitivity E Martinez, P Yadav, M Bouttemy, O Renault, F Bertin, A Etcheberry, ... Journal of Electron Spectroscopy and Related Phenomena 191, 86-91, 2013 | 18 | 2013 |
| Work function measurement of silicon germanium heterostructures combining kelvin force microscopy and x-ray photoelectron emission microscopy S Pouch, M Amato, M Bertocchi, S Ossicini, N Chevalier, T Mélin, ... The Journal of Physical Chemistry C 119 (47), 26776-26782, 2015 | 14 | 2015 |
| Correlative analysis of embedded silicon interface passivation by Kelvin probe force microscopy and corona oxide characterization of semiconductor V Aubriet, K Courouble, M Gros-Jean, Ł Borowik Review of Scientific Instruments 92 (8), 2021 | 12 | 2021 |
| Mapping charge transfers between quantum levels using noncontact atomic force microscopy K Kusiaku, D Deresmes, D Théron, H Diesinger, T Mélin, T Nguyen-Tran, ... Physical Review B 82 (7), 073302, 2010 | 12 | 2010 |
| Hidden surface photovoltages revealed by pump probe KPFM V Aubriet, K Courouble, O Bardagot, R Demadrille, Ł Borowik, B Grévin Nanotechnology 33 (22), 225401, 2022 | 11 | 2022 |
| Doped semiconductor nanocrystal junctions Ł Borowik, T Nguyen-Tran, P Roca i Cabarrocas, T Melin Journal of Applied Physics 114 (20), 2013 | 11 | 2013 |
| The influence of strain on dewetting of silicon films Ł Borowik, N Chevalier, D Mariolle, F Bertin, A Chabli, JC Barbé Journal of applied physics 114 (6), 2013 | 11 | 2013 |
| Controlled synthesis of SiC nanoparticles from surface silicon contamination Ł Borowik, N Chevalier, D Mariolle, E Martinez, F Bertin, A Chabli, ... Thin solid films 527, 133-136, 2013 | 9 | 2013 |
| Influence of shape and size on GaN/InGaN μLED light emission: A competition between sidewall defects and light extraction efficiency P González-Izquierdo, N Rochat, D Zoccarato, F Rol, J Simon, P Le Maitre, ... ACS Photonics 10 (11), 4031-4037, 2023 | 7 | 2023 |
| From Solid-State Dewetting of Ultrathin, Compressively Strained Silicon–Germanium-on-Insulator Films to Mastering the Stoichiometry of Si1–xGex Nanocrystals Y Almadori, Ł Borowik, N Chevalier, W Hourani, F Glowacki, JC Barbe The Journal of Physical Chemistry C 120 (13), 7412-7420, 2016 | 6 | 2016 |
| Engineering the size and density of silicon agglomerates by controlling the initial surface carbonated contamination N Chevalier, D Mariolle, E Martinez, F Bertin, A Chabli, JC Barbé Applied surface science 270, 295-300, 2013 | 6 | 2013 |
| Surface and intrinsic conduction properties of Au-catalyzed Si nanowires Ł Borowik, I Florea, D Deresmes, O Ersen, D Hourlier, T Melin The Journal of Physical Chemistry C 116 (11), 6601-6607, 2012 | 6 | 2012 |
Pere Roca i CabarrocasLPICM, CNRS, Ecole Polytechnique, and IPVFVerified email at polytechnique.edu
