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Carlos Roberto Nogueira
Carlos Roberto Nogueira
UNESP - Instituto de Ciência e Tecnologia - Sorocaba
Verified email at unesp.br
Title
Cited by
Cited by
Year
Low-Frequency noise investigation of AlGaN/GaN high-electron-mobility transistors
MGC de Andrade, LF de Oliveira Bergamim, BB Júnior, CR Nogueira, ...
Solid-State Electronics 183, 108050, 2021
62021
Electrical parameters and low-frequency noise of AlGaN/GaN high-electron mobility transistors with different channel orientation
MGC de Andrade, CR Nogueira, NG Júnior, RT Doria, R Trevisoli, ...
Solid-State Electronics 211, 108807, 2024
2024
Temperature Dependence of AlGaN/GaN High Electron Mobility Transistors on 200 mm Si wafers
BB Junior, MGC De Andrade, LF de Oliveira Bergamim, CR Nogueira, ...
2022 IEEE Latin American Electron Devices Conference (LAEDC), 1-4, 2022
2022
Temperature Dependence of AlGaN/GaN High Electron Mobility Transistors on 200 mm Si wafers
B Baptista Junior, MG Cano de Andrade, LF de Oliveira Bergamim, ...
IEEE, 2022
2022
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Articles 1–4