关注
Robert M. Suter
Robert M. Suter
在 cmu.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
X-ray structure determination of fully hydrated L alpha phase dipalmitoylphosphatidylcholine bilayers
JF Nagle, R Zhang, S Tristram-Nagle, W Sun, HI Petrache, RM Suter
Biophysical journal 70 (3), 1419-1431, 1996
6151996
Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders
HF Poulsen, SF Nielsen, EM Lauridsen, S Schmidt, RM Suter, U Lienert, ...
Journal of applied crystallography 34 (6), 751-756, 2001
4122001
Interbilayer interactions from high-resolution x-ray scattering
HI Petrache, N Gouliaev, S Tristram-Nagle, R Zhang, RM Suter, JF Nagle
Physical Review E 57 (6), 7014, 1998
3181998
Measurement of chain tilt angle in fully hydrated bilayers of gel phase lecithins
S Tristram-Nagle, R Zhang, RM Suter, CR Worthington, WJ Sun, JF Nagle
Biophysical journal 64 (4), 1097-1109, 1993
3181993
Structure of the fully hydrated gel phase of dipalmitoylphosphatidylcholine
MC Wiener, RM Suter, JF Nagle
Biophysical journal 55 (2), 315-325, 1989
3051989
Defect structure process maps for laser powder bed fusion additive manufacturing
JV Gordon, SP Narra, RW Cunningham, H Liu, H Chen, RM Suter, ...
Additive Manufacturing 36, 101552, 2020
2842020
Theory of the structure factor of lipid bilayers
R Zhang, RM Suter, JF Nagle
Physical Review E 50 (6), 5047, 1994
2671994
Order and disorder in fully hydrated unoriented bilayers of gel-phase dipalmitoylphosphatidylcholine
WJ Sun, RM Suter, MA Knewtson, CR Worthington, S Tristram-Nagle, ...
Physical Review E 49 (5), 4665, 1994
2631994
Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification
RM Suter, D Hennessy, C Xiao, U Lienert
Review of scientific instruments 77 (12), 2006
2612006
Tracking: a method for structural characterization of grains in powders or polycrystals
EM Lauridsen, S Schmidt, RM Suter, HF Poulsen
Journal of applied crystallography 34 (6), 744-750, 2001
2392001
High-energy diffraction microscopy at the advanced photon source
U Lienert, SF Li, CM Hefferan, J Lind, RM Suter, JV Bernier, NR Barton, ...
Jom 63, 70-77, 2011
2192011
Direct measurement of critical resolved shear stress of prismatic and basal slip in polycrystalline Ti using high energy X-ray diffraction microscopy
L Wang, Z Zheng, H Phukan, P Kenesei, JS Park, J Lind, RM Suter, ...
Acta Materialia 132, 598-610, 2017
2002017
Structure of gel phase saturated lecithin bilayers: temperature and chain length dependence
WJ Sun, S Tristram-Nagle, RM Suter, JF Nagle
Biophysical journal 71 (2), 885-891, 1996
1791996
Data reduction methodology for perturbed angular correlation experiments
AR Arends, C Hohenemser, F Pleiter, H De Waard, L Chow, RM Suter
Hyperfine Interactions 8, 191-213, 1980
1791980
Structure of the ripple phase in lecithin bilayers.
WJ Sun, S Tristram-Nagle, RM Suter, JF Nagle
Proceedings of the National Academy of Sciences 93 (14), 7008-7012, 1996
1681996
Polycrystal plasticity: comparison between grain-scale observations of deformation and simulations
R Pokharel, J Lind, AK Kanjarla, RA Lebensohn, SF Li, P Kenesei, ...
Annu. Rev. Condens. Matter Phys. 5 (1), 317-346, 2014
1652014
Adaptive reconstruction method for three-dimensional orientation imaging
SF Li, RM Suter
Journal of Applied Crystallography 46 (2), 512-524, 2013
1572013
Small-angle x-ray scattering from lipid bilayers is well described by modified Caillé theory but not by paracrystalline theory
R Zhang, S Tristram-Nagle, W Sun, RL Headrick, TC Irving, RM Suter, ...
Biophysical journal 70 (1), 349-357, 1996
1341996
New opportunities for quantitative tracking of polycrystal responses in three dimensions
JC Schuren, PA Shade, JV Bernier, SF Li, B Blank, J Lind, P Kenesei, ...
Current Opinion in Solid State and Materials Science 19 (4), 235-244, 2015
1322015
In-situ observation of bulk 3D grain evolution during plastic deformation in polycrystalline Cu
R Pokharel, J Lind, SF Li, P Kenesei, RA Lebensohn, RM Suter, ...
International Journal of Plasticity 67, 217-234, 2015
1152015
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