| Development of a Multispectral Gastroendoscope to Improve the Detection of Precancerous Lesions in Digestive Gastroendoscopy SEM Herrera, Y Benezeth, M Boffety, F Goudail, D Lamarque, JF Emile, ... Doctoral Consortium on Computer Vision, Imaging and Computer Graphics Theory …, 2014 | 164 | 2014 |
| Shape-from-Polarization in laparoscopy SEM Herrera, A Malti, O Morel, A Bartoli 2013 IEEE 10th International Symposium on Biomedical Imaging, 1412-1415, 2013 | 28 | 2013 |
| Identification of precancerous lesions by multispectral gastroendoscopy SE Martinez-Herrera, Y Benezeth, M Boffety, JF Emile, F Marzani, ... Signal, Image and Video Processing 10, 455-462, 2016 | 11 | 2016 |
| Multispectral endoscopy to identify precancerous lesions in gastric mucosa SE Martinez-Herrera, Y Benezeth, M Boffety, JF Emile, F Marzani, ... Image and Signal Processing: 6th International Conference, ICISP 2014 …, 2014 | 10 | 2014 |
| Cognitive learning: a machine learning approach for automatic process characterization from design J Foucher, J Baderot, S Martinez, A Dervilllé, G Bernard Metrology, Inspection, and Process Control for Microlithography XXXII 10585 …, 2018 | 9 | 2018 |
| The coming of age of the first hybrid metrology software platform dedicated to nanotechnologies (Conference Presentation) J Foucher, A Labrosse, A Dervillé, Y Zimmermann, G Bernard, S Martinez, ... Metrology, Inspection, and Process Control for Microlithography XXXI 10145 …, 2017 | 8 | 2017 |
| Designed tools for analysis of lithography patterns and nanostructures A Dervilllé, J Baderot, G Bernard, J Foucher, H Grönqvist, A Labrosse, ... Proc. SPIE 10145, Metrology, Inspection, and Process Control for …, 2017 | 8 | 2017 |
| Multispectral imaging detects gastritis consistently in mouse model and in humans T Bazin, SE Martinez-Herrera, A Jobart-Malfait, Y Benezeth, M Boffety, ... Scientific Reports 10 (1), 20047, 2020 | 5 | 2020 |
| Machine Learning assistant technology to facilitate Fin and 3D memory measurements on SEM and TEM images J Baderot, B Darbon, N Clement, M Bryan, S Martinez, J Foucher Advanced Etch Technology for Nanopatterning IX 11329, 92-100, 2020 | 4 | 2020 |
| Introducing machine learning-based application for writer main pole CD metrology by dual beam FIB/SEM A Zandiatashbar, A Ngo, C Chien, J Baderot, S Martinez, B Darbon, ... Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021 | 3 | 2021 |
| Using machine learning technology to accelerate the development of plasma etching processes A Derville, G Gey, J Baderot, S Martinez, G Bernard, J Foucher Advanced Etch Technology for Nanopatterning VIII 10963, 64-71, 2019 | 3 | 2019 |
| Semi-automatic tools for nanoscale metrology and annotations for deep learning automation on electron microscopy images IW Sanou, J Baderot, Y Benezeth, S Bricq, F Marzani, S Martinez, ... Sixteenth International Conference on Quality Control by Artificial Vision …, 2023 | 2 | 2023 |
| Application of machine learning-based metrology for writer main pole CD measurement by CDSEM Y Yang, A Ngo, M Wang, C Chien, J Baderot, A Hallal, S Martinez, ... Metrology, Inspection, and Process Control XXXVI 12053, 564-577, 2022 | 2 | 2022 |
| Parametric modeling of patterned object with variations and expert tuning of edge placement B Darbon, M Grould, N Clément, J Baderot, S Martinez, J Foucher Advanced Etch Technology and Process Integration for Nanopatterning X 11615 …, 2021 | 2 | 2021 |
| Accelerate the analysis and optimization of lamellar BCP process using machine learning A Derville, S Martinez, G Gey, J Baderot, G Bernard, X Chevalier, ... Advances in Patterning Materials and Processes XXXVI 10960, 102-107, 2019 | 2 | 2019 |
| Application of deep-learning based techniques for automatic metrology on scanning and transmission electron microscopy images J Baderot, M Grould, D Misra, N Clément, A Hallal, S Martinez, J Foucher Journal of Vacuum Science & Technology B 40 (5), 2022 | 1 | 2022 |
| Edge detection using deep learning pipelines for TEM and SEM metrology by proposing generic and specific approaches E Loza, J Baderot, M Grould, E Pery, F Chausse, S Martinez, J Foucher Metrology, Inspection, and Process Control XXXVII 12496, 694-707, 2023 | | 2023 |
| A generic deep-learning-based defect segmentation model for electron micrographs for automatic defect inspection M Jacob, A Hallal, J Baderot, V Barra, A Guillin, S Martinez, J Foucher Metrology, Inspection, and Process Control XXXVII 12496, 732-739, 2023 | | 2023 |
| Automatic Classification of C-SAM Voids for Root Cause Identification of Bonding Yield Degradation J Baderot, S Garrais, S Martinez, J Foucher, R Eto, K Tanida, T Yasui, ... 2022 International Symposium on Semiconductor Manufacturing (ISSM), 1-4, 2022 | | 2022 |
| Multispectral imaging detects gastritis consistently in mouse model and in humans (vol 10, 20047, 2021) T Bazin, SE Martinez-Herrera, A Jobart-Malfait, Y Benezeth, M Boffety, ... SCIENTIFIC REPORTS 11 (1), 2021 | | 2021 |
Franck MarzaniImViA EA7535 - Universite de Bourgogne - FranceVerified email at u-bourgogne.fr
