| Electron holography studies of the charge on dislocations in GaN D Cherns, CG Jiao Physical review letters 87 (20), 205504, 2001 | 181 | 2001 |
| Organically linked iron oxide nanoparticle supercrystals with exceptional isotropic mechanical properties A Dreyer, A Feld, A Kornowski, ED Yilmaz, H Noei, A Meyer, T Krekeler, ... Nature materials 15 (5), 522-528, 2016 | 166 | 2016 |
| Microstructure degradation of an anode/electrolyte interface in SOFC studied by transmission electron microscopy YL Liu, C Jiao Solid state ionics 176 (5-6), 435-442, 2005 | 161 | 2005 |
| Electron holography studies of the charge on dislocations in GaN D Cherns, CG Jiao, H Mokhtari, J Cai, FA Ponce physica status solidi (b) 234 (3), 924-930, 2002 | 65 | 2002 |
| Three-dimensional electron backscattered diffraction analysis of deformation in MgO micropillars S Korte, M Ritter, C Jiao, PA Midgley, WJ Clegg Acta materialia 59 (19), 7241-7254, 2011 | 56 | 2011 |
| Visualizing the 3D Architecture of Multiple Erythrocytes Infected with Plasmodium at Nanoscale by Focused Ion Beam-Scanning Electron Microscopy LC Soares Medeiros, W De Souza, C Jiao, H Barrabin, K Miranda PLoS One 7 (3), e33445, 2012 | 41 | 2012 |
| Role of constituent intermetallic phases and precipitates in initiation and propagation of intergranular corrosion of an Al-Li-Cu-Mg alloy X Xu, M Hao, J Chen, W He, G Li, K Li, C Jiao, XL Zhong, KL Moore, ... Corrosion Science 201, 110294, 2022 | 33 | 2022 |
| 3D Nanofabrication of High‐Resolution Multilayer Fresnel Zone Plates UT Sanli, C Jiao, M Baluktsian, C Grévent, K Hahn, Y Wang, V Srot, ... Advanced Science 5 (9), 1800346, 2018 | 29 | 2018 |
| Influence of microstructural and crystallographic inhomogeneity on tensile anisotropy in thick-section Al–Li–Cu–Mg plates X Xu, M Hao, J Chen, W He, G Li, C Jiao, TL Burnett, X Zhou Materials Science and Engineering: A 829, 142135, 2022 | 25 | 2022 |
| Novel organic photovoltaic polymer blends: A rapid, 3-dimensional morphology analysis using backscattered electron imaging in the scanning electron microscope RC Masters, Q Wan, Y Zhang, M Dapor, AM Sandu, C Jiao, Y Zhou, ... Solar Energy Materials and Solar Cells 160, 182-192, 2017 | 20 | 2017 |
| Investigation of the charge on threading edge dislocations in GaN by electron holography C Jiao, D Cherns Journal of electron microscopy 51 (2), 105-112, 2002 | 17 | 2002 |
| Magnetic sector secondary ion mass spectrometry on FIB-SEM instruments for nanoscale chemical imaging O De Castro, JN Audinot, HQ Hoang, C Coulbary, O Bouton, R Barrahma, ... Analytical chemistry 94 (30), 10754-10763, 2022 | 16 | 2022 |
| Characterisation of hollow Russian doll microspheres S Begum, IP Jones, C Jiao, DE Lynch, JA Preece Journal of materials science 45, 3697-3706, 2010 | 16 | 2010 |
| Profiling band structure in GaN devices by electron holography D Cherns, H Mokhtari, CG Jiao, R Averbeck, H Riechert Journal of crystal growth 230 (3-4), 410-414, 2001 | 16 | 2001 |
| Application of high-spatial-resolution secondary ion mass spectrometry for nanoscale chemical mapping of lithium in an Al-Li alloy X Xu, C Jiao, K Li, M Hao, KL Moore, TL Burnett, X Zhou Materials Characterization 181, 111442, 2021 | 13 | 2021 |
| Liftout of high-quality thin sections of a perovskite oxide thin film using a xenon plasma focused ion beam microscope I MacLaren, M Nord, C Jiao, E Yücelen Microscopy and Microanalysis 25 (1), 115-118, 2019 | 11 | 2019 |
| Three-dimensional time-of-flight secondary ion mass spectrometry and DualBeam FIB/SEM imaging of lithium-ion battery cathode C Jiao, L Pillatsch, J Mulders, D Wall Microscopy and Microanalysis 25 (S2), 876-877, 2019 | 8 | 2019 |
| New methods for the study and fabrication of nano-structured materials using FIB SEM DJ Stokes, O Wilhelmi, S Reyntjens, C Jiao, L Roussel Journal of Nanoscience and Nanotechnology 9 (2), 1268-1271, 2009 | 7 | 2009 |
| The generation of misfit dislocations in AlGaN/GaN films CG Jiao, D Cherns Microscopy of Semiconducting Materials 2001, 327-332, 2018 | 6 | 2018 |
| Methods for Structuring and Prototyping on a Nanoscale using a DualBeam F Morrissey, S Reyntjens, K Nakahara, C Jiao Microscopy and Microanalysis 11 (S02), 820-821, 2005 | 5 | 2005 |
