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Tianming Ni
Tianming Ni
Anhui Polytechnic University
Verified email at ahpu.edu.cn
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Year
Architecture of cobweb-based redundant TSV for clustered faults
T Ni, D Liu, Q Xu, Z Huang, H Liang, A Yan
IEEE transactions on very large scale integration (VLSI) systems 28 (7 …, 2020
1542020
Information assurance through redundant design: A novel TNU error-resilient latch for harsh radiation environment
A Yan, Y Hu, J Cui, Z Chen, Z Huang, T Ni, P Girard, X Wen
IEEE Transactions on Computers 69 (6), 789-799, 2020
832020
LCHR-TSV: Novel low cost and highly repairable honeycomb-based TSV redundancy architecture for clustered faults
T Ni, Y Yao, H Chang, L Lu, H Liang, A Yan, Z Huang, X Wen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019
632019
Novel quadruple-node-upset-tolerant latch designs with optimized overhead for reliable computing in harsh radiation environments
A Yan, Z Xu, X Feng, J Cui, Z Chen, T Ni, Z Huang, P Girard, X Wen
IEEE transactions on emerging topics in computing 10 (1), 404-413, 2020
622020
Novel speed-and-power-optimized SRAM cell designs with enhanced self-recoverability from single-and double-node upsets
A Yan, Y Chen, Y Hu, J Zhou, T Ni, J Cui, P Girard, X Wen
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (12), 4684-4695, 2020
542020
A novel TDMA-based fault tolerance technique for the TSVs in 3D-ICs using honeycomb topology
T Ni, Z Yang, H Chang, X Zhang, L Lu, A Yan, Z Huang, X Wen
IEEE transactions on emerging topics in computing 9 (2), 724-734, 2020
542020
Non-intrusive online distributed pulse shrinking-based interconnect testing in 2.5 D IC
T Ni, H Chang, T Song, Q Xu, Z Huang, H Liang, A Yan, X Wen
IEEE transactions on circuits and systems II: express briefs 67 (11), 2657-2661, 2019
542019
Quadruple and sextuple cross-coupled SRAM cell designs with optimized overhead for reliable applications
A Yan, J Xiang, A Cao, Z He, J Cui, T Ni, Z Huang, X Wen, P Girard
IEEE Transactions on Device and Materials Reliability 22 (2), 282-295, 2022
402022
A methodology for characterization of SET propagation in SRAM-based FPGAs
H Liang, X Xu, Z Huang, C Jiang, Y Lu, A Yan, T Ni, Y Ouyang, M Yi
IEEE Transactions on Nuclear Science 63 (6), 2985-2992, 2016
382016
Design of true random number generator based on multi-stage feedback ring oscillator
J Cui, M Yi, D Cao, L Yao, X Wang, H Liang, Z Huang, H Qi, T Ni, Y Lu
IEEE Transactions on Circuits and Systems II: Express Briefs 69 (3), 1752-1756, 2021
352021
A cost-effective TSV repair architecture for clustered faults in 3-D IC
T Ni, Q Xu, Z Huang, H Liang, A Yan, X Wen
IEEE transactions on computer-aided design of integrated circuits and …, 2020
352020
Designs of two quadruple-node-upset self-recoverable latches for highly robust computing in harsh radiation environments
A Yan, Z Li, J Cui, Z Huang, T Ni, P Girard, X Wen
IEEE Transactions on Aerospace and Electronic Systems, 2022
342022
LDAVPM: A latch design and algorithm-based verification protected against multiple-node-upsets in harsh radiation environments
A Yan, Z Li, J Cui, Z Huang, T Ni, P Girard, X Wen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022
302022
Thermodynamic and economic analysis of a novel cascade waste heat recovery system for solid oxide fuel cell
T Ni, J Si, X Gong, K Zhang, M Pan
Energy Conversion and Management 259, 115562, 2022
232022
Performance analysis and optimization of cascade waste heat recovery system based on transcritical CO2 cycle for waste heat recovery in waste-to-energy plant
T Ni, J Si, F Lu, Y Zhu, M Pan
Journal of Cleaner Production 331, 129949, 2022
232022
Temperature-aware floorplanning for fixed-outline 3D ICs
T Ni, H Chang, S Zhu, L Lu, X Li, Q Xu, H Liang, Z Huang
IEEE Access 7, 139787-139794, 2019
212019
A pulse shrinking-based test solution for prebond through silicon via in 3-D ICs
M Yi, J Bian, T Ni, C Jiang, H Chang, H Liang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018
202018
A highly reliable butterfly PUF in SRAM-based FPGAs
X Xu, H Liang, Z Huang, C Jiang, Y Ouyang, X Fang, T Ni, M Yi
IEICE Electronics Express 14 (14), 20170551-20170551, 2017
182017
Calibration of SQUID magnetometers in multichannel MCG system based on bi-planar coil
K Yang, D Wu, W Gao, T Ni, Q Zhang, H Zhang, D Huang
IEEE Transactions on Instrumentation and Measurement 71, 1-9, 2022
162022
Nonvolatile Latch Designs With Node-Upset Tolerance and Recovery Using Magnetic Tunnel Junctions and CMOS
A Yan, L Wang, J Cui, Z Huang, T Ni, P Girard, X Wen
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023
152023
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