| Semi‐transparent NiO/ZnO UV photovoltaic cells R Karsthof, P Räcke, H Von Wenckstern, M Grundmann physica status solidi (a) 213 (1), 30-37, 2016 | 84 | 2016 |
| Detection of small bunches of ions using image charges P Räcke, D Spemann, JW Gerlach, B Rauschenbach, J Meijer Scientific reports 8 (1), 9781, 2018 | 37 | 2018 |
| Vacancy diffusion and nitrogen-vacancy center formation near the diamond surface P Räcke, L Pietzonka, J Meijer, D Spemann, R Wunderlich Applied Physics Letters 118 (20), 2021 | 13 | 2021 |
| Nanoscale ion implantation using focussed highly charged ions P Räcke, R Wunderlich, JW Gerlach, J Meijer, D Spemann New Journal of Physics 22 (8), 083028, 2020 | 13 | 2020 |
| Image charge detection statistics relevant for deterministic ion implantation P Räcke, R Staacke, JW Gerlach, J Meijer, D Spemann Journal of Physics D: Applied Physics 52 (30), 305103, 2019 | 13 | 2019 |
| Image charge detection of ion bunches using a segmented, cryogenic detector P Räcke, J Meijer, D Spemann Journal of Applied Physics 131 (20), 2022 | 5 | 2022 |
| Creation of quantum centers in silicon using spatial selective ion implantation of high lateral resolution T Herzig, P Räcke, N Raatz, D Spemann, W Redjem, JW Gerlach, J Meijer, ... 2018 22nd International Conference on Ion Implantation Technology (IIT), 136-139, 2018 | 5 | 2018 |
| Near-surface electrical characterization of silicon electronic devices using focused keV-range ions SG Robson, P Räcke, AM Jakob, N Collins, HR Firgau, V Schmitt, ... Physical Review Applied 18 (3), 034037, 2022 | 4 | 2022 |
| Semi‐transparent NiO/ZnO UV photovoltaic cells (Phys. Status Solidi A 1∕ 2016) R Karsthof, P Räcke, H von Wenckstern, M Grundmann physica status solidi (a) 213 (1), 224-224, 2016 | 3 | 2016 |
| Graphene‐Enhanced Single Ion Detectors for Deterministic Near‐Surface Dopant Implantation in Diamond NFL Collins, AM Jakob, SG Robson, SQ Lim, P Räcke, BC Johnson, B Liu, ... Advanced Functional Materials 33 (51), 2306601, 2023 | 2 | 2023 |
| Color center formation by deterministic single ion implantation T Herzig, T Luehmann, P Raecke, C Scheuner, S Pezzagna, J Meijer Semiconductors and Semimetals 104, 1-30, 2021 | 2 | 2021 |
| Image charge detection for deterministic ion implantation P Räcke Universität Leipzig, 2020 | 2 | 2020 |
| FIB-based Single Ion Implantation with> 99% Detection Confidence-Towards Near-Surface Donor Qubit Architectures in Silicon S Robson, P Räcke, A Jakob, N Collins, H Firgau, V Schmitt, V Mourik, ... APS March Meeting Abstracts 2022, Z39. 008, 2022 | | 2022 |
| Deterministic Focused Ion Beam Implantation with 99.6% Yield for High-Fidelity Shallow Donor Arrays in Silicon SG Robson, P Räcke, AM Jakob, N Collins, HR Firgau, V Schmitt, ... arXiv e-prints, arXiv: 2201.11339, 2022 | | 2022 |
| OC7: Focused Beams of Highly Charged Ions for Quantum Technologies P Räcke, D Reinhardt, J Meijer, D Spemann Sponsors, 23, 0 | | |
Daniel SpemannGroup leader, Leibniz Institute of Surface Engineering (IOM)Verified email at iom-leipzig.de
