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Cuong Manh Nguyen (Alfred Nguyen)
Cuong Manh Nguyen (Alfred Nguyen)
Other namesCuong Nguyen, Cuong Manh Nguyen, Manh Cuong Nguyen
Scientist
Verified email at i2r.a-star.edu.sg - Homepage
Title
Cited by
Cited by
Year
Semi-supervised classification of diagnostic radiographs with noteacher: A teacher that is not mean
B Unnikrishnan, CM Nguyen, S Balaram, CS Foo, P Krishnaswamy
Medical Image Computing and Computer Assisted Intervention–MICCAI 2020: 23rd …, 2020
222020
Partial Bayesian co-training for virtual metrology
CM Nguyen, X Li, RDS Blanton, X Li
IEEE Transactions on Industrial Informatics 16 (5), 2937-2945, 2019
202019
Consistency-based semi-supervised evidential active learning for diagnostic radiograph classification
S Balaram, CM Nguyen, A Kassim, P Krishnaswamy
International Conference on Medical Image Computing and Computer-Assisted …, 2022
152022
Semicurv: Semi-supervised curvilinear structure segmentation
X Xu, MC Nguyen, Y Yazici, K Lu, H Min, CS Foo
IEEE Transactions on Image Processing 31, 5109-5120, 2022
92022
Revisiting pretraining for semi-supervised learning in the low-label regime
X Xu, J Liao, L Cai, MC Nguyen, K Lu, W Zhang, Y Yazici, CS Foo
Neurocomputing 565, 126971, 2024
82024
Semi-supervised classification of radiology images with NoTeacher: A teacher that is not mean
B Unnikrishnan, C Nguyen, S Balaram, C Li, CS Foo, P Krishnaswamy
Medical Image Analysis 73, 102148, 2021
82021
COFT-AD: COntrastive Fine-Tuning for Few-Shot Anomaly Detection
J Liao, X Xu, MC Nguyen, A Goodge, CS Foo
IEEE Transactions on Image Processing, 2024
62024
Correlated Bayesian co-training for virtual metrology
C Nguyen, X Li, S Blanton, X Li
IEEE Transactions on Semiconductor Manufacturing 36 (1), 28-36, 2022
42022
Partial co-training for virtual metrology
C Nguyen, X Li, RDS Blanton, X Li
2017 22nd IEEE International Conference on Emerging Technologies and Factory …, 2017
42017
Armoured: Adversarially robust models using unlabeled data by regularizing diversity
K Lu, CM Nguyen, X Xu, K Krishnamachari, YJ Goh, CS Foo
International Conference on Learning Representations, 2021
32021
Efficient classification via partial co-training for virtual metrology
C Nguyen, X Li, S Blanton, X Li
2020 25th IEEE International conference on emerging technologies and factory …, 2020
32020
Training neural networks with classification rules for incorporating domain knowledge
W Zhang, F Liu, CM Nguyen, ZLO Yang, S Ramasamy, CS Foo
Knowledge-Based Systems 294, 111716, 2024
12024
On Adversarial Robustness of Audio Classifiers
K Lu, MC Nguyen, X Xu, CS Foo
ICASSP 2023-2023 IEEE International Conference on Acoustics, Speech and …, 2023
12023
Diverse and consistent multi-view networks for semi-supervised regression
C Nguyen, A Raja, L Zhang, X Xu, B Unnikrishnan, M Ragab, K Lu, ...
Machine Learning 112 (7), 2359-2395, 2023
2023
Few-Shot Anomaly Detection on Industrial Images through Contrastive Fine-Tuning
J Liao, X Xu, MC Nguyen, CS Foo
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Articles 1–15