Investigation of Cl2 etch in view of extremely low temperature selective epitaxial processes A Hikavyy, A Kruv, T Van Opstal, B De Vos, C Porret, R Loo Semiconductor Science and Technology 32 (11), 114006, 2017 | 18 | 2017 |
Impact of mechanical stress on the electrical performance of 3D NAND A Kruv, A Arreghini, M Gonzalez, D Verreck, I De Wolf, A Furnémont 2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019 | 13 | 2019 |
Hot-electron-induced punch-through (HEIP) effect in p-MOSFET enhanced by mechanical stress K Lee, B Kaczer, A Kruv, M Gonzalez, R Degraeve, S Tyaginov, A Grill, ... IEEE Electron Device Letters 42 (10), 1424-1427, 2021 | 12 | 2021 |
Impact of mechanical strain on wakeup of HfO2 ferroelectric memory A Kruv, SRC McMitchell, S Clima, OO Okudur, N Ronchi, M Gonzalez, ... 2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021 | 9 | 2021 |
On the impact of mechanical stress on gate oxide trapping A Kruv, B Kaczer, A Grill, M Gonzalez, J Franco, D Linten, W Goes, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 7 | 2020 |
Gate-induced-drain-leakage (GIDL) in CMOS enhanced by mechanical stress K Lee, B Kaczer, A Kruv, M Gonzalez, G Eneman, OO Okudur, A Grill, ... IEEE Transactions on Electron Devices 69 (4), 2214-2217, 2022 | 6 | 2022 |
Impact of mechanical stress on 3-D NAND flash current conduction A Kruv, A Arreghini, D Verreck, M Gonzalez, I De Wolf, M Rosmeulen IEEE Transactions on Electron Devices 67 (11), 4891-4896, 2020 | 5 | 2020 |
Implantable highly compliant devices for heating of internal organs: toward cancer treatment GS Cañón Bermúdez, A Kruv, T Voitsekhivska, I Hochnadel, A Lebanov, ... Advanced Engineering Materials 21 (9), 1900407, 2019 | 5 | 2019 |
A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication A Kruv, M Gonzalez, OO Okudur, V Spampinato, A Franquet, SV Palayam, ... Microelectronic Engineering 254, 111660, 2022 | 4 | 2022 |
Study of the mechanical stress impact on silicide contact resistance by 4-point bending Y Liu, H Yu, G Hiblot, A Kruv, M Schaekers, N Horiguchi, D Velenis, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019 | 2 | 2019 |
Significant enhancement of HCD and TDDB in CMOS FETs by mechanical stress K Lee, B Kaczer, A Kruv, M Gonzalez, G Eneman, OO Okudur, A Grill, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 10A. 3-1-10A. 3-6, 2022 | 1 | 2022 |
The Impact of IGZO Channel Composition on DRAM Transistor Performance A Kruv, MJ Van Setten, HFW Dekkers, C Lorant, D Verreck, Q Smets, ... IEEE Transactions on Electron Devices, 2023 | | 2023 |
Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs K Lee, B Kaczer, A Kruv, M Gonzalez, G Eneman, OO Okudur, A Grill, ... IEEE Transactions on Electron Devices 69 (9), 5382-5385, 2022 | | 2022 |
Analysis of the Impact of Mechanical Stress on Three-Dimensional Memory Devices A Kruv | | 2022 |
Impact of mechanical stress on wakeup of HfO2 ferroelectric memory A Kruv, S McMitchell, S Clima, OO Okudur, N Ronchi, G Van den Bosch, ... | | 2021 |
Impact of mechanical stress on 3-D NAND current conduction A Kruv, A Arreghini, D Verreck, M Gonzalez, G Van den Bosch, I De Wolf, ... | | 2020 |