关注
Yu Huang
Yu Huang
HiSilicon Co.
在 hisilicon.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm
Y Huang, SM Reddy, WT Cheng, P Reuter, N Mukherjee, CC Tsai, ...
Proceedings. International Test Conference, 74-82, 2002
2152002
Resource allocation and test scheduling for concurrent test of core-based SOC design
Y Huang, WT Cheng, CC Tsai, N Mukherjee, O Samman, Y Zaidan, ...
Proceedings 10th Asian Test Symposium, 265-270, 2001
1872001
Bit selection algorithm suitable for high-volume production of SRAM-PUF
K Xiao, MT Rahman, D Forte, Y Huang, M Su, M Tehranipoor
2014 IEEE international symposium on hardware-oriented security and trust …, 2014
1672014
SOC test scheduling using simulated annealing
W Zou, SM Reddy, I Pomeranz, Y Huang
Proceedings. 21st VLSI Test Symposium, 2003., 325-330, 2003
1462003
Survey of scan chain diagnosis
Y Huang, R Guo, WT Cheng, JCM Li
IEEE Design & Test of Computers 25 (3), 240-248, 2008
1042008
Statistical diagnosis for intermittent scan chain hold-time fault
Y Huang, WT Cheng, SM Reddy, CJ Hsieh, YT Hung
ITC, 319-328, 2003
862003
Compactor independent direct diagnosis of test hardware
Y Huang, WT Cheng, J Rajski
US Patent 7,729,884, 2010
702010
Compactor independent direct diagnosis
WT Cheng, KH Tsai, Y Huang, N Tamarapalli, J Rajski
13th Asian Test Symposium, 204-209, 2004
672004
Effects of embedded decompression and compaction architectures on side-channel attack resistance
C Liu, Y Huang
25th IEEE VLSI Test Symposium (VTS'07), 461-468, 2007
622007
Compressed pattern diagnosis for scan chain failures
Y Huang, WT Cheng, J Rajski
IEEE International Conference on Test, 2005., 8 pp.-751, 2005
612005
Compactor independent fault diagnosis
WT Cheng, KH Tsai, Y Huang, N Tamarapalli, J Rajski
US Patent 7,239,978, 2007
52*2007
Diagnosis with limited failure information
Y Huang, WT Cheng, N Tamarapalli, J Rajski, R Klingenberg, W Hsu, ...
2006 IEEE International Test Conference, 1-10, 2006
442006
Scan chain diagnosis by adaptive signal profiling with manufacturing ATPG patterns
Y Huang, WT Cheng, R Guo, TP Tai, FM Kuo, YS Chen
2009 Asian Test Symposium, 35-40, 2009
432009
Fault dictionary-based scan chain failure diagnosis
R Guo, Y Huang, WT Cheng
US Patent 8,615,695, 2013
42*2013
Dynamic learning based scan chain diagnosis
Y Huang
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007
412007
Functionality matters in netlist representation learning
Z Wang, C Bai, Z He, G Zhang, Q Xu, TY Ho, B Yu, Y Huang
Proceedings of the 59th ACM/IEEE Design Automation Conference, 61-66, 2022
402022
Improved volume diagnosis throughput using dynamic design partitioning
X Fan, H Tang, Y Huang, WT Cheng, SM Reddy, B Benware
2012 IEEE International Test Conference, 1-10, 2012
402012
On concurrent test of core-based SOC design
Y Huang, WT Cheng, CC Tsai, N Mukherjee, O Samman, Y Zaidan, ...
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation, 37-50, 2002
392002
Deep Learning Based Test Compression Analyzer
Y Huang, WT Cheng, G Veda, J Rajski
US Patent App. 16/376,315, 2019
382019
Intermittent scan chain fault diagnosis based on signal probability analysis
Y Huang, WT Cheng, CJ Hsieh, HY Tseng, A Huang, YT Hung
Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004
382004
系统目前无法执行此操作,请稍后再试。
文章 1–20