Optimal core wrapper width selection and SOC test scheduling based on 3-D bin packing algorithm Y Huang, SM Reddy, WT Cheng, P Reuter, N Mukherjee, CC Tsai, ... Proceedings. International Test Conference, 74-82, 2002 | 215 | 2002 |
Resource allocation and test scheduling for concurrent test of core-based SOC design Y Huang, WT Cheng, CC Tsai, N Mukherjee, O Samman, Y Zaidan, ... Proceedings 10th Asian Test Symposium, 265-270, 2001 | 187 | 2001 |
Bit selection algorithm suitable for high-volume production of SRAM-PUF K Xiao, MT Rahman, D Forte, Y Huang, M Su, M Tehranipoor 2014 IEEE international symposium on hardware-oriented security and trust …, 2014 | 167 | 2014 |
SOC test scheduling using simulated annealing W Zou, SM Reddy, I Pomeranz, Y Huang Proceedings. 21st VLSI Test Symposium, 2003., 325-330, 2003 | 146 | 2003 |
Survey of scan chain diagnosis Y Huang, R Guo, WT Cheng, JCM Li IEEE Design & Test of Computers 25 (3), 240-248, 2008 | 104 | 2008 |
Statistical diagnosis for intermittent scan chain hold-time fault Y Huang, WT Cheng, SM Reddy, CJ Hsieh, YT Hung ITC, 319-328, 2003 | 86 | 2003 |
Compactor independent direct diagnosis of test hardware Y Huang, WT Cheng, J Rajski US Patent 7,729,884, 2010 | 70 | 2010 |
Compactor independent direct diagnosis WT Cheng, KH Tsai, Y Huang, N Tamarapalli, J Rajski 13th Asian Test Symposium, 204-209, 2004 | 67 | 2004 |
Effects of embedded decompression and compaction architectures on side-channel attack resistance C Liu, Y Huang 25th IEEE VLSI Test Symposium (VTS'07), 461-468, 2007 | 62 | 2007 |
Compressed pattern diagnosis for scan chain failures Y Huang, WT Cheng, J Rajski IEEE International Conference on Test, 2005., 8 pp.-751, 2005 | 61 | 2005 |
Compactor independent fault diagnosis WT Cheng, KH Tsai, Y Huang, N Tamarapalli, J Rajski US Patent 7,239,978, 2007 | 52* | 2007 |
Diagnosis with limited failure information Y Huang, WT Cheng, N Tamarapalli, J Rajski, R Klingenberg, W Hsu, ... 2006 IEEE International Test Conference, 1-10, 2006 | 44 | 2006 |
Scan chain diagnosis by adaptive signal profiling with manufacturing ATPG patterns Y Huang, WT Cheng, R Guo, TP Tai, FM Kuo, YS Chen 2009 Asian Test Symposium, 35-40, 2009 | 43 | 2009 |
Fault dictionary-based scan chain failure diagnosis R Guo, Y Huang, WT Cheng US Patent 8,615,695, 2013 | 42* | 2013 |
Dynamic learning based scan chain diagnosis Y Huang 2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007 | 41 | 2007 |
Functionality matters in netlist representation learning Z Wang, C Bai, Z He, G Zhang, Q Xu, TY Ho, B Yu, Y Huang Proceedings of the 59th ACM/IEEE Design Automation Conference, 61-66, 2022 | 40 | 2022 |
Improved volume diagnosis throughput using dynamic design partitioning X Fan, H Tang, Y Huang, WT Cheng, SM Reddy, B Benware 2012 IEEE International Test Conference, 1-10, 2012 | 40 | 2012 |
On concurrent test of core-based SOC design Y Huang, WT Cheng, CC Tsai, N Mukherjee, O Samman, Y Zaidan, ... SOC (System-on-a-Chip) Testing for Plug and Play Test Automation, 37-50, 2002 | 39 | 2002 |
Deep Learning Based Test Compression Analyzer Y Huang, WT Cheng, G Veda, J Rajski US Patent App. 16/376,315, 2019 | 38 | 2019 |
Intermittent scan chain fault diagnosis based on signal probability analysis Y Huang, WT Cheng, CJ Hsieh, HY Tseng, A Huang, YT Hung Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004 | 38 | 2004 |