Layout hotspot detection with feature tensor generation and deep biased learning H Yang, J Su, Y Zou, B Yu, EFY Young Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017 | 127 | 2017 |
GAN-OPC: Mask optimization with lithography-guided generative adversarial nets H Yang, S Li, Y Ma, B Yu, EFY Young Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018 | 124 | 2018 |
Machine learning for electronic design automation: A survey G Huang, J Hu, Y He, J Liu, M Ma, Z Shen, J Wu, Y Xu, H Zhang, K Zhong, ... ACM Transactions on Design Automation of Electronic Systems (TODAES) 26 (5 …, 2021 | 117 | 2021 |
Imbalance aware lithography hotspot detection: a deep learning approach H Yang, L Luo, J Su, C Lin, B Yu Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (3), 033504-033504, 2017 | 99 | 2017 |
Faster region-based hotspot detection R Chen, W Zhong, H Yang, H Geng, X Zeng, B Yu Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 48 | 2019 |
Lithography hotspot detection: From shallow to deep learning H Yang, Y Lin, B Yu, EFY Young 2017 30th IEEE International System-on-Chip Conference (SOCC), 233-238, 2017 | 41 | 2017 |
SRAF insertion via supervised dictionary learning H Geng, H Yang, Y Ma, J Mitra, B Yu Proceedings of the 24th Asia and South Pacific Design Automation Conference …, 2019 | 32 | 2019 |
Hotspot detection via attention-based deep layout metric learning H Geng, H Yang, L Zhang, J Miao, F Yang, X Zeng, B Yu Proceedings of the 39th International Conference on Computer-Aided Design, 1-8, 2020 | 30 | 2020 |
DAMO: Deep agile mask optimization for full chip scale G Chen, W Chen, Y Ma, H Yang, B Yu Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020 | 28 | 2020 |
DeePattern: Layout pattern generation with transforming convolutional auto-encoder H Yang, P Pathak, F Gennari, YC Lai, B Yu Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 27 | 2019 |
Adversarial perturbation attacks on ML-based CAD: A case study on CNN-based lithographic hotspot detection K Liu, H Yang, Y Ma, B Tan, B Yu, EFY Young, R Karri, S Garg ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020 | 25 | 2020 |
Attacking split manufacturing from a deep learning perspective H Li, S Patnaik, A Sengupta, H Yang, J Knechtel, B Yu, EFY Young, ... Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 23 | 2019 |
Detecting multi-layer layout hotspots with adaptive squish patterns H Yang, P Pathak, F Gennari, YC Lai, B Yu Proceedings of the 24th Asia and South Pacific Design Automation Conference …, 2019 | 23 | 2019 |
Bridging the Gap Between Layout Pattern Sampling and Hotspot Detection via Batch Active Learning H Yang, S Li, C Tabery, B Lin, B Yu arXiv preprint arXiv:1807.06446, 2018 | 18 | 2018 |
VLSI mask optimization: From shallow to deep learning H Yang, W Zhong, Y Ma, H Geng, R Chen, W Chen, B Yu Integration 77, 96-103, 2021 | 17 | 2021 |
Deep learning-driven simultaneous layout decomposition and mask optimization W Zhong, S Hu, Y Ma, H Yang, X Ma, B Yu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 13 | 2021 |
Sparse VLSI layout feature extraction: A dictionary learning approach H Geng, H Yang, B Yu, X Li, X Zeng 2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 488-493, 2018 | 13 | 2018 |
Attacking a cnn-based layout hotspot detector using group gradient method H Yang, S Zhang, K Liu, S Liu, B Tan, R Karri, S Garg, B Yu, EFY Young Proceedings of the 26th Asia and South Pacific Design Automation Conference …, 2021 | 10 | 2021 |
Deep learning analysis for split-manufactured layouts with routing perturbation H Li, S Patnaik, M Ashraf, H Yang, J Knechtel, B Yu, O Sinanoglu, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 10 | 2020 |
An edge-on charge-transfer design for energy-resolved x-ray detection Z Shi, H Yang, W Cong, G Wang Physics in Medicine & Biology 61 (11), 4183, 2016 | 10 | 2016 |