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Victor M. van Santen
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Towards interdependencies of aging mechanisms
H Amrouch, VM van Santen, T Ebi, V Wenzel, J Henkel
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 478-485, 2014
962014
Reliability in super-and near-threshold computing: A unified model of RTN, BTI, and PV
VM Van Santen, J Martin-Martinez, H Amrouch, MM Nafria, J Henkel
IEEE Transactions on Circuits and Systems I: Regular Papers 65 (1), 293-306, 2017
482017
Impact of BTI on dynamic and static power: From the physical to circuit level
H Amrouch, S Mishra, V van Santen, S Mahapatra, J Henkel
2017 IEEE International Reliability Physics Symposium (IRPS), CR-3.1-CR-3.6, 2017
422017
Aging-aware voltage scaling
VM Van Santen, H Amrouch, N Parihar, S Mahapatra, J Henkel
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 576-581, 2016
412016
Designing guardbands for instantaneous aging effects
VM van Santen, H Amrouch, J Martin-Martinez, M Nafria, J Henkel
Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016
352016
Connecting the physical and application level towards grasping aging effects
H Amrouch, J Martin-Martinez, VM van Santen, M Moras, R Rodriguez, ...
2015 IEEE International Reliability Physics Symposium, 3D. 1.1-3D. 1.8, 2015
272015
On the reliability of FeFET on-chip memory
PR Genssler, VM van Santen, J Henkel, H Amrouch
IEEE Transactions on Computers 71 (4), 947-958, 2021
232021
Modeling emerging technologies using machine learning: Challenges and opportunities
F Klemme, J Prinz, VM van Santen, J Henkel, H Amrouch
Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020
232020
NCFET to rescue technology scaling: Opportunities and challenges
H Amrouch, VM van Santen, G Pahwa, Y Chauhan, J Henkel
2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 637-644, 2020
192020
Interdependencies of degradation effects and their impact on computing
H Amrouch, VM van Santen, J Henkel
IEEE Design & Test 34 (3), 59-67, 2016
182016
Reliability challenges with self-heating and aging in finfet technology
H Amrouch, VM van Santen, O Prakash, H Kattan, S Salamin, S Thomann, ...
2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019
172019
Modeling and mitigating time-dependent variability from the physical level to the circuit level
VM van Santen, H Amrouch, J Henkel
IEEE Transactions on Circuits and Systems I: Regular Papers 66 (7), 2671-2684, 2019
172019
New worst-case timing for standard cells under aging effects
VM van Santen, H Amrouch, J Henkel
IEEE Transactions on Device and Materials Reliability 19 (1), 149-158, 2019
172019
Bti and hcd degradation in a complete 32× 64 bit sram array–including sense amplifiers and write drivers–under processor activity
VM van Santen, S Thomann, C Pasupuleti, PR Genssler, N Gangwar, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2020
152020
Modeling the interdependences between voltage fluctuation and BTI aging
S Salamin, VM Van Santen, H Amrouch, N Parihar, S Mahapatra, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (7 …, 2019
152019
Minimizing excess timing guard banding under transistor self-heating through biasing at zero-temperature coefficient
S Salamin, VM Van Santen, M Rapp, J Henkel, H Amrouch
IEEE access 9, 30687-30697, 2021
122021
On the workload dependence of self-heating in finfet circuits
VM Van Santen, H Amrouch, P Kumari, J Henkel
IEEE Transactions on Circuits and Systems II: Express Briefs 67 (10), 1949-1953, 2019
122019
Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability
VM Van Santen, J Diaz-Fortuny, H Amrouch, J Martin-Martinez, ...
2018 IEEE International Reliability Physics Symposium (IRPS), P-CR. 6-1-P-CR …, 2018
112018
Special session: Machine learning for semiconductor test and reliability
H Amrouch, AB Chowdhury, W Jin, R Karri, F Khorrami, P Krishnamurthy, ...
2021 IEEE 39th VLSI Test Symposium (VTS), 1-11, 2021
92021
Fn-cacti: Advanced cacti for finfet and nc-finfet technologies
DP Ravipati, R Kedia, VM Van Santen, J Henkel, PR Panda, H Amrouch
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 30 (3), 339-352, 2021
82021
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