| Modeling of single event transients with dual double-exponential current sources: Implications for logic cell characterization DA Black, WH Robinson, IZ Wilcox, DB Limbrick, JD Black IEEE Transactions on Nuclear Science 62 (4), 1540-1549, 2015 | 128 | 2015 |
| Fault simulation and emulation tools to augment radiation-hardness assurance testing HM Quinn, DA Black, WH Robinson, SP Buchner IEEE Transactions on Nuclear Science 60 (3), 2119-2142, 2013 | 121 | 2013 |
| Mitigation techniques for single-event-induced charge sharing in a 90-nm bulk CMOS process OA Amusan, LW Massengill, MP Baze, BL Bhuva, AF Witulski, JD Black, ... IEEE Transactions on device and Materials Reliability 9 (2), 311-317, 2009 | 117 | 2009 |
| Characterizing SRAM single event upset in terms of single and multiple node charge collection JD Black, DR Ball Ii, WH Robinson, DM Fleetwood, RD Schrimpf, ... IEEE Transactions on Nuclear Science 55 (6), 2943-2947, 2008 | 109 | 2008 |
| C-CREST technique for combinational logic SET testing JR Ahlbin, JD Black, LW Massengill, OA Amusan, A Balasubramanian, ... IEEE Transactions on Nuclear Science 55 (6), 3347-3351, 2008 | 50 | 2008 |
| Impact of logic synthesis on soft error vulnerability using a 90-nm bulk CMOS digital cell library DB Limbrick, DA Black, K Dick, NM Atkinson, NJ Gaspard, JD Black, ... 2011 Proceedings of IEEE Southeastcon, 430-434, 2011 | 24 | 2011 |
| Thermal neutron-induced single-event upsets in microcontrollers containing boron-10 EC Auden, HM Quinn, SA Wender, JM O’Donnell, PW Lisowski, ... IEEE Transactions on Nuclear Science 67 (1), 29-37, 2019 | 23 | 2019 |
| NSREC 2016 Special Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE S Abe, D Adams, P Adell, P Agopian, MA Aguirre, J Ahlbin, A Akkerman, ... IEEE Transactions on Nuclear Science 64 (1), 11, 2017 | 17 | 2017 |
| Using MRED to screen multiple-node charge-collection mitigated SOI layouts JD Black, JA Dame, DA Black, PE Dodd, MR Shaneyfelt, J Teifel, ... IEEE Transactions on Nuclear Science 66 (1), 233-239, 2018 | 9 | 2018 |
| Impact of surface recombination on single-event charge collection in an SOI technology AM Tonigan, D Ball, G Vizkelethy, J Black, D Black, J Trippe, E Bielejec, ... IEEE Transactions on Nuclear Science 68 (3), 305-311, 2021 | 8 | 2021 |
| DFF layout variations in CMOS SOI—Analysis of hardening by design options JD Black, DA Black, NA Domme, PE Dodd, PJ Griffin, RN Nowlin, ... IEEE Transactions on Nuclear Science 67 (6), 1125-1132, 2020 | 6 | 2020 |
| Direct ionization-induced transient fault analysis for combinational logic and sequential capture in digital integrated circuits for lightly-ionizing environments DA Black Vanderbilt University, 2011 | 6 | 2011 |
| Measuring and modeling single event transients in 12-nm inverters S Agarwal, LT Clark, C Youngsciortino, G Ng, D Black, M Cannon, J Black, ... IEEE Transactions on Nuclear Science 69 (3), 414-421, 2022 | 5 | 2022 |
| Multiscale system modeling of single-event-induced faults in advanced node processors M Cannon, A Rodrigues, D Black, J Black, L Bustamante, M Breeding, ... IEEE Transactions on Nuclear Science 68 (5), 980-990, 2021 | 4 | 2021 |
| Understanding the Implications of a LINAC’s Microstructure on Devices and Photocurrent Models ML McLain, JK McDonald, CE Hembree, TJ Sheridan, TA Weingartner, ... IEEE Transactions on Nuclear Science 65 (1), 184-191, 2017 | 4 | 2017 |
| Trade space involved with single event upset (SEU) and transient (SET) handling of field programmable gate array (FPGA) based systems K Label, M Berg, D Black, W Robinson, A Jordan 2006 Workshop on Hardened Electronics and Radiation Technology (Heart), 2006 | 3 | 2006 |
| The Effects of Gamma Ray Integrated Dose on a Commercial 65nm SRAM Device W Stirk, DA Black, JD Black, M Breeding, RP Cuoco, M Wirthlin, ... IEEE Transactions on Nuclear Science, 2023 | 2 | 2023 |
| Radiation and Self Heating Effects in Hetero-Junction Bipolar Transistors. CE Hembree, IZ Wilcox, M Martinez, L Musson, DA Black, JK McDonald, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2018 | 1 | 2018 |
| Dynamic Testing of a Commercial FRAM Device Under Gamma Ray Dose and Neutron Beam N Harris, W Stirk, D Black, J Black, M Wirthlin, J Goeders IEEE Transactions on Nuclear Science, 2024 | | 2024 |
| The Effects of Gamma Ray Integrated Dose on a Commercial 65nm SRAM Device. J Black, D Black, R Cuoco, W Stirk, J Goeders, M Wirthlin Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2022 | | 2022 |
