| Multivariate alternating decision trees HK Sok, MPL Ooi, YC Kuang, S Demidenko Pattern Recognition 50, 195-209, 2016 | 77 | 2016 |
| Defect cluster recognition system for fabricated semiconductor wafers MPL Ooi, HK Sok, YC Kuang, S Demidenko, C Chan Engineering Applications of Artificial Intelligence 26 (3), 1029-1043, 2013 | 67 | 2013 |
| Sparse alternating decision tree HK Sok, MPL Ooi, YC Kuang Pattern Recognition Letters 60, 57-64, 2015 | 27 | 2015 |
| Alternating decision trees MPL Ooi, HK Sok, YC Kuang, S Demidenko Handbook of Neural Computation, 345-371, 2017 | 9 | 2017 |
| Using the ADTree for feature reduction through knowledge discovery HK Sok, MS Chowdhury, MPL Ooi, YC Kuang, S Demidenko 2013 IEEE International Instrumentation and Measurement Technology …, 2013 | 9 | 2013 |
| Identifying Systematic Failures on Semiconductor Wafers using High Volume Production Test Data MPL Ooi, HK Sok, YC Kuang, H Cheng, EKJ Sim, S Demidenko, C Chan | | |
