| Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation VA Niranjan, D Neethirajan, C Xanthopoulos, E De La Rosa, C Alleyne, ... 2021 IEEE 39th VLSI Test Symposium (VTS), 1-7, 2021 | 8 | 2021 |
| Wafer-Level Adaptive Vmin Calibration Seed Forecasting C Xanthopoulos, D Neethirajan, S Boddikurapati, A Nahar, Y Makris 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2019 | 4 | 2019 |
| Machine Learning-based Noise Classification and Decomposition in RF Transceivers D Neethirajan, C Xanthopoulos, K Subramani, K Schaub, I Leventhal, ... 2019 IEEE 37th VLSI Test Symposium (VTS), 1-6, 2019 | 2 | 2019 |
| Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing VA Niranjan, D Neethirajan, C Xanthopoulos, D Webster, A Nahar, ... 2023 IEEE 41st VLSI Test Symposium (VTS), 1-7, 2023 | | 2023 |
| Machine Learning-based Solutions for Comprehending and Mitigating Imperfections of Semiconductor Manufacturing and Testing D Neethirajan | | 2022 |
| Machine Learning-Based Overkill Reduction through Inter-Test Correlation D Neethirajan, VA Niranjan, R Willis, A Nahar, D Webster, Y Makris 2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022 | | 2022 |
| Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion K Ikeda, K Schaub, I Leventhal, Y Makris, C Xanthopoulos, D Neethirajan 2019 IEEE International Test Conference (ITC), 1-3, 2019 | | 2019 |
| Wafer-Level Adaptive Vₘᵢₙ Calibration Seed Forecasting C Xanthopoulos, D Neethirajan, S Boddikurapati, A Nahar, Y Makris Institute of Electrical and Electronics Engineers Inc., 2019 | | 2019 |
| Machine-Learning Based Overkill Reduction using Correlation within the Probe Tests VA Niranjan, D Neethirajan, D Webster, A Nahar, Y Makris | | |
| Reducing Underkill Using Unsupervised Machine-Learning Based Method in Analog/RF IC Testing VA Niranjan, D Neethirajan, D Webster, A Nahar, Y Makris | | |
| Wafer-Level Adaptive Vmin Seed Forecasting D Neethirajan, C Xanthopoulos, S Boddikurapati, A Nahar, Y Makris | | |
| Wafer-Level Adaptive Vmin Calibration Seed Forecasting using Inter-Vmin Correlation D Neethirajan, C Xanthopoulos, S Boddikurapati, A Nahar, Y Makris | | |
Yiorgos MakrisThe University of Texas at DallasVerified email at utdallas.edu
