| Material properties of interfacial silicate layer and its influence on the electrical characteristics of MOS devices using hafnia as the gate dielectric H Wong, B Sen, V Filip, MC Poon Thin Solid Films 504 (1-2), 192-196, 2006 | 64 | 2006 |
| Trapping characteristics of lanthanum oxide gate dielectric film explored from temperature dependent current–voltage and capacitance–voltage measurements B Sen, H Wong, J Molina, H Iwai, JA Ng, K Kakushima, CK Sarkar Solid-state electronics 51 (3), 475-480, 2007 | 59 | 2007 |
| Electrical characteristics of high-κ dielectric film grown by direct sputtering method B Sen, CK Sarkar, H Wong, M Chan, CW Kok Solid-state electronics 50 (2), 237-240, 2006 | 29 | 2006 |
| Piezoelectricity in wurtzite polar semiconductor nanowires: A theoretical study B Sen, M Stroscio, M Dutta Journal of Applied Physics 110, 024506, 2011 | 28 | 2011 |
| Effects and mechanisms of nitrogen incorporation into hafnium oxide by plasma immersion implantation H Wong, B Sen, BL Yang, AP Huang, PK Chu Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2007 | 25 | 2007 |
| Current transport and high-field reliability of aluminum/hafnium oxide/silicon structure B Sen, H Wong, V Filip, HY Choi, CK Sarkar, M Chan, CW Kok, MC Poon Thin Solid Films 504 (1-2), 312-316, 2006 | 23 | 2006 |
| Aptamer-based optical bionano sensor for mercury (II) ions KL Brenneman, B Sen, MA Stroscio, M Dutta 2010 IEEE Nanotechnology Materials and Devices Conference, 221-224, 2010 | 17 | 2010 |
| Effects of aluminum incorporation on hafnium oxide film using plasma immersion ion implantation B Sen, BL Yang, H Wong, CW Kok, PK Chu, A Huang Microelectronics Reliability 48 (11-12), 1765-1768, 2008 | 17 | 2008 |
| Photoluminescence and Raman Spectroscopy of Polycrystalline ZnO Nanofibers Deposited by Electrospinning B Sen, M Stroscio, M Dutta Journal of electronic materials, 1-5, 2011 | 12 | 2011 |
| Nitrogen incorporation into hafnium oxide films by plasma immersion ion implantation B Sen, H Wong, BL Yang, AP Huang, PK Chu, V Filip, CK Sarkar Japanese journal of applied physics 46 (5S), 3234, 2007 | 12 | 2007 |
| Piezoelectricity in zincblende polar semiconductor nanowires: A theoretical study B Sen, M Stroscio, M Dutta Journal of Applied Physics 111 (5), 2012 | 8 | 2012 |
| Piezoelectricity in lead zirconate titanate nanowires: A theoretical study B Sen, M Stroscio, M Dutta Journal of Applied Physics 112 (2), 2012 | 5 | 2012 |
| A double-layer current conduction model for high-κ gate dielectric materials with interfacial oxide or silicate layer V Filip, H Wong, B Sen, D Nicolaescu, CK Sarkar Microelectronic engineering 83 (10), 1950-1956, 2006 | 5 | 2006 |
| Optoelectronic applications of colloidal quantum dots Z Wang, N Zhang, K Brenneman, TC Wu, H Jung, S Biswas, B Sen, ... Quantum Dot Devices, 351-367, 2012 | 4 | 2012 |
| Effects of nitrogen incorporation into lanthana film by plasma immersion ion implantation B Sen, H Wong, BL Yang, PK Chu, K Kakushima, H Iwai Solid-State Electronics 53 (3), 355-358, 2009 | 4 | 2009 |
| Electrical Stability Improvement for Lanthanum Oxide Films by Nitrogen Incorporation using Plasma Immersion Ion Implantation B Sen, BL Yang, H Wong, CW Kok, MK Bera, PK Chu, A Huang, ... Electron Devices and Solid-State Circuits, 2007. EDSSC 2007. IEEE Conference …, 2007 | 4 | 2007 |
| Stressing effects on the charge trapping of silicon oxynitride prepared by thermal oxidation of LPCVD Si-rich silicon nitride HY Choi, H Wong, V Filip, B Sen, CW Kok, M Chan, MC Poon Thin solid films 504 (1-2), 7-10, 2006 | 3 | 2006 |
| Nanosensors based on DNA and RNA aptamers and semiconductor quantum dots M Dutta, MA Stroscio, J Qian, T Wu, K Brenneman, B Sen, S Poduri, K Xu, ... Dekker encyclopedia of nanoscience and nanotechnology. 3rd Edition. New York …, 2014 | 2 | 2014 |
| Semiconductor Quantum Dots: Nanosensors Based on DNA and RNA Aptamers M Dutta, MA Stroscio, J Qian, TC Wu, K Brenneman, B Sen, S Poduri, ... Dekker Encyclopedia of Nanoscience and Nanotechnology, Third Edition, Seven …, 2014 | 2 | 2014 |
| Effects of Ambient Temperature on the Electrical Characteristics of Thin La2O3Film Grown by E-Beam Evaporation B Sen, H Wong, J Molina, CK Sarkar, H Iwai, JA Ng Electron Devices and Solid-State Circuits, 2005 IEEE Conference on, 173-176, 2005 | 1 | 2005 |
Hei WongCity University of Hong Kong在 ieee.org 的电子邮件经过验证
