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Riccio Michele
Riccio Michele
University of Naples Federico II - Department of Electrical Engineering and Information technologies
Verified email at unina.it - Homepage
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Cited by
Year
A Comprehensive Study of the Short-circuit Ruggedness of Silicon Carbide Power MOSFETs
G Romano, A Fayyaz, M Riccio, L Maresca, G Breglio, A Castellazzi, ...
IEEE Journal of Emerging and Selected Topics in Power Electronics, 1-1, 2016
2372016
SiC power MOSFETs performance, robustness and technology maturity
A Castellazzi, A Fayyaz, L Romano, Gianpaolo, Yang, M Riccio, A Irace
Microelectronics Reliability 57, 2016
1232016
Short-circuit failure mechanism of SiC power MOSFETs
G Romano, L Maresca, M Riccio, V d'Alessandro, G Breglio, A Irace, ...
2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's …, 2015
942015
Short-circuit robustness of SiC power MOSFETs: Experimental analysis
A Castellazzi, A Fayyaz, L Yang, M Riccio, A Irace
2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014
782014
Experimental detection and numerical validation of different failure mechanisms in IGBTs during unclamped inductive switching
G Breglio, A Irace, E Napoli, M Riccio, P Spirito
IEEE Transactions on Electron Devices 60 (2), 563-570, 2012
722012
A temperature-dependent SPICE model of SiC Power MOSFETs for within and out-of-SOA simulations
M Riccio, V d'Alessandro, G Romano, L Maresca, G Breglio, A Irace
IEEE Transactions on Power Electronics, 1-1, 2017
642017
Experimental analysis of electro-thermal instability in SiC Power MOSFETs
M Riccio, A Castellazzi, G De Falco, A Irace
Microelectronics Reliability 53 (9-11), 1739-1744, 2013
622013
UIS failure mechanism of SiC power MOSFETs
A Fayyaz, A Castellazzi, G Romano, M Riccio, A Irace, J Urresti, N Wright
2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2016
512016
SPICE modeling and dynamic electrothermal simulation of SiC power MOSFETs
V d'Alessandro, A Magnani, M Riccio, G Breglio, A Irace, N Rinaldi, ...
2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014
502014
A comprehensive study on the avalanche breakdown robustness of silicon carbide power MOSFETs
A Fayyaz, G Romano, J Urresti, M Riccio, A Castellazzi, A Irace, N Wright
Energies 10 (4), 452, 2017
432017
Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs
AI A. Fayyaz, , L. Yang, M. Riccio, A. Castellazzi
Microelectronics Reliability, 2014
422014
Electro-thermal instability in multi-cellular trench-IGBTs in avalanche condition: Experiments and simulations
M Riccio, A Irace, G Breglio, P Spirito, E Napoli, Y Mizuno
2011 IEEE 23rd International Symposium on Power Semiconductor Devices and …, 2011
422011
Relationship between albuminuric CKD and diabetic retinopathy in a real-world setting of type 2 diabetes: Findings from No blind study
FC Sasso, PC Pafundi, A Gelso, V Bono, C Costagliola, R Marfella, ...
Nutrition, Metabolism and Cardiovascular Diseases 29 (9), 923-930, 2019
412019
Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs
A Borghese, M Riccio, A Fayyaz, A Castellazzi, L Maresca, G Breglio, ...
IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019
412019
50W X-band GaN MMIC HPA: Effective power capability and transient thermal analysis
C Costrini, A Cetronio, P Romanini, G Breglio, A Irace, M Riccio
The 40th European Microwave Conference, 1650-1653, 2010
352010
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography
M Riccio, L Rossi, A Irace, E Napoli, G Breglio, P Spirito, R Tagami, ...
Microelectronics Reliability 50 (9-11), 1725-1730, 2010
342010
Influence of design parameters on the short-circuit ruggedness of SiC power MOSFETs
G Romano, M Riccio, L Maresca, G Breglio, A Irace, A Fayyaz, ...
2016 28th International Symposium on Power Semiconductor Devices and ICs …, 2016
322016
Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations
V d’Alessandro, A Magnani, M Riccio, Y Iwahashi, G Breglio, N Rinaldi, ...
Microelectronics Reliability 53 (9-11), 1713-1718, 2013
312013
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography
G Breglio, A Irace, E Napoli, M Riccio, P Spirito, K Hamada, T Nishijima, ...
Microelectronics Reliability 48 (8-9), 1432-1434, 2008
302008
An equivalent time temperature mapping system with a 320× 256pixels full-frame 100kHz sampling rate
M Riccio, G Breglio, A Irace, P Spirito
Review of Scientific Instruments 78 (10), 2007
302007
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