| A placement-aware soft error rate estimation of combinational circuits for multiple transient faults in CMOS technology GI Paliaroutis, P Tsoumanis, N Evmorfopoulos, G Dimitriou, GI Stamoulis 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2018 | 15 | 2018 |
| A layout-based soft error rate estimation and mitigation in the presence of multiple transient faults in combinational logic C Georgakidis, GI Paliaroutis, N Sketopoulos, P Tsoumanis, C Sotiriou, ... 2020 21st International Symposium on Quality Electronic Design (ISQED), 231-236, 2020 | 13 | 2020 |
| Set pulse characterization and ser estimation in combinational logic with placement and multiple transient faults considerations GI Paliaroutis, P Tsoumanis, N Evmorfopoulos, G Dimitriou, GI Stamoulis Technologies 8 (1), 5, 2020 | 9 | 2020 |
| Analysis of the impact of electrical and timing masking on soft error rate estimation in vlsi circuits P Tsoumanis, GI Paliaroutis, N Evmorfopoulos, G Stamoulis Technologies 10 (1), 23, 2022 | 6 | 2022 |
| Placement-based SER estimation in the presence of multiple faults in combinational logic GI Paliaroutis, P Tsoumanis, N Evmorfopoulos, G Dimitriou, GI Stamoulis 2017 27th International Symposium on Power and Timing Modeling, Optimization …, 2017 | 6 | 2017 |
| SER analysis of multiple transient faults in combinational logic GI Paliaroutis, P Tsoumanis, G Dimitriou, GI Stamoulis Proceedings of the SouthEast European Design Automation, Computer …, 2016 | 5 | 2016 |
| Multiple transient faults in combinational logic with placement considerations GI Paliaroutis, P Tsoumanis, N Evmorfopoulos, G Dimitriou, GI Stamoulis 2019 8th International Conference on Modern Circuits and Systems …, 2019 | 4 | 2019 |
| On the impact of electrical masking and timing analysis on soft error rate estimation in deep submicron technologies P Tsoumanis, GI Paliaroutis, N Evmorfopoulos, G Stamoulis 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2021 | 2 | 2021 |
| Accurate Soft Error Rate Evaluation Using Event-Driven Dynamic Timing Analysis GI Paliaroutis, P Tsoumanis, D Garyfallou, A Vagenas, N Evmorfopoulos, ... 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2023 | | 2023 |
| Μοντέλα και αλγόριθμοι προσομοίωσης μηχανισμών πρόκλησης μεταβατικών σφαλμάτων σε ολοκληρωμένα κυκλώματα ΠΣ Τσουμάνης | | 2021 |
| Placement-based SER estimation in the presence of multiple faults in combinational logic G Ioannis Paliaroutis, P Tsoumanis, N Evmorfopoulos, G Dimitriou, ... | | 2017 |
| SER Analysis for Multiple Affected Gates GI Paliaroutis, P Tsoumanis, G Dimitriou, GI Stamoulis | | |
