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Changhyeon Han
Changhyeon Han
Verified email at hanyang.ac.kr
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Year
Synergistic improvement of sensing performance in ferroelectric transistor gas sensors using remnant polarization
W Shin, J Yim, JH Bae, JK Lee, S Hong, J Kim, Y Jeong, D Kwon, RH Koo, ...
Materials Horizons 9 (6), 1623-1630, 2022
142022
Effects of oxygen vacancies on ferroelectric characteristics of RF-sputtered Hf0. 5Zr0. 5O2
C Han, KR Kwon, J Kim, J Yim, S Kim, EC Park, JW You, S Jeong, R Choi, ...
Materials Science in Semiconductor Processing 160, 107401, 2023
42023
Effects of RTA Rising Time on Ferroelectric Characteristics of HfZrO2
C Han, SJ Kwon, J Yim, J Kim, S Kim, S Jeong, EC Park, JW You, R Choi, ...
IEEE Transactions on Electron Devices 69 (6), 3499-3502, 2022
42022
Ferroelectric Field-Effect Transistor Synaptic Device with Hafnium-silicate Interlayer
SW Kim, W Shin, M Kim, KR Kwon, J Yim, J Kim, C Han, S Jeong, EC Park, ...
IEEE Electron Device Letters, 2023
22023
Ferroelectric polarization-switching acceleration of sputtered Hf0. 5Zr0. 5O2 with defect-induced polarization of interlayer
C Han, J Yim, A Nguyen, J Kim, KR Kwon, S Kim, S Jeong, EC Park, ...
Journal of Alloys and Compounds 960, 170516, 2023
12023
All-Sputter-Deposited Hf0.5Zr0.5O2 Double-Gate Ferroelectric Thin-Film Transistor with Amorphous Indium–Gallium–Zinc Oxide Channel
S Jeong, C Han, J Yim, J Kim, KR Kwon, S Kim, EC Park, JW You, R Choi, ...
IEEE Electron Device Letters, 2023
12023
Effects of Deposition Power and Thermal Treatment on Ferroelectric Properties of Sputtered HfZrO
C Han, KR Kwon, J Yim, J Kim, S Kim, S Jeong, EC Park, JW You, R Choi, ...
IEEE Transactions on Electron Devices, 2024
2024
Analysis on Degradation of Ferroelectric Memory
S Kim, J Kim, S Jeong, K Kwon, C Han, E Park, J Yim, B Kwak, J You, ...
한국차세대컴퓨팅학회 학술대회, 212-213, 2022
2022
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