Follow
Nadine Collaert
Nadine Collaert
Verified email at imec.be
Title
Cited by
Cited by
Year
Gate-induced quantum-confinement transition of a single dopant atom in a silicon FinFET
GP Lansbergen, R Rahman, CJ Wellard, I Woo, J Caro, N Collaert, ...
Nature Physics 4 (8), 656-661, 2008
4482008
Analysis of the parasitic S/D resistance in multiple-gate FETs
A Dixit, A Kottantharayil, N Collaert, M Goodwin, M Jurczak, K De Meyer
IEEE Transactions on Electron Devices 52 (6), 1132-1140, 2005
4382005
Transport spectroscopy of a single dopant in a gated silicon nanowire
H Sellier, GP Lansbergen, J Caro, S Rogge, N Collaert, I Ferain, ...
Physical Review Letters 97 (20), 206805, 2006
3602006
Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification
B Kaczer, V Arkhipov, R Degraeve, N Collaert, G Groeseneken, ...
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings …, 2005
2262005
Vertical GAAFETs for the ultimate CMOS scaling
D Yakimets, G Eneman, P Schuddinck, TH Bao, MG Bardon, P Raghavan, ...
IEEE Transactions on Electron Devices 62 (5), 1433-1439, 2015
2072015
Review of FINFET technology
M Jurczak, N Collaert, A Veloso, T Hoffmann, S Biesemans
2009 IEEE international SOI conference, 1-4, 2009
1992009
Planar Bulk MOSFETs Versus FinFETs: An Analog/RF Perspective
V Subramanian, B Parvais, J Borremans, A Mercha, D Linten, P Wambacq, ...
IEEE Transactions on Electron Devices 53 (12), 3071-3079, 2006
1922006
Integrated semiconductor fin device and a method for manufacturing such device
N Collaert, K De Meyer
US Patent 6,974,729, 2005
1712005
Fabrication and Analysis of a Heterojunction Line Tunnel FET
AM Walke, A Vandooren, R Rooyackers, D Leonelli, A Hikavyy, R Loo, ...
IEEE Transactions on Electron Devices 61 (3), 707-715, 2014
1442014
Multi-gate devices for the 32 nm technology node and beyond
N Collaert, A De Keersgieter, A Dixit, I Ferain, LS Lai, D Lenoble, ...
Solid-State Electronics 52 (9), 1291-1296, 2008
1302008
FinFET analogue characterization from DC to 110 GHz
D Lederer, V Kilchytska, T Rudenko, N Collaert, D Flandre, A Dixit, ...
Solid-State Electronics 49 (9), 1488-1496, 2005
1272005
InGaAs gate-all-around nanowire devices on 300mm Si substrates
N Waldron, C Merckling, L Teugels, P Ong, SAU Ibrahim, F Sebaai, ...
IEEE Electron Device Letters 35 (11), 1097-1099, 2014
1182014
Heteroepitaxy of InP on Si (001) by selective-area metal organic vapor-phase epitaxy in sub-50 nm width trenches: The role of the nucleation layer and the recess engineering
C Merckling, N Waldron, S Jiang, W Guo, N Collaert, M Caymax, ...
Journal of Applied Physics 115 (2), 2014
1182014
Impact of fin width on digital and analog performances of n-FinFETs
V Subramanian, A Mercha, B Parvais, J Loo, C Gustin, M Dehan, ...
Solid-State Electronics 51 (4), 551-559, 2007
1152007
An InGaAs/InP quantum well finfet using the replacement fin process integrated in an RMG flow on 300mm Si substrates
N Waldron, C Merckling, W Guo, P Ong, L Teugels, S Ansar, ...
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical …, 2014
1092014
Single-cell recording and stimulation with a 16k micro-nail electrode array integrated on a 0.18 μm CMOS chip
R Huys, D Braeken, D Jans, A Stassen, N Collaert, J Wouters, J Loo, ...
Lab on a Chip 12 (7), 1274-1280, 2012
1082012
Highly manufacturable FinFETs with sub-10nm fin width and high aspect ratio fabricated with immersion lithography
MJH Van Dal, N Collaert, G Doornbos, G Vellianitis, G Curatola, ...
2007 IEEE symposium on VLSI technology, 110-111, 2007
1032007
Tall triple-gate devices with TiN/HfO/sub 2/gate stack
N Collaert, M Demand, I Ferain, J Lisoni, R Singanamalla, P Zimmerman, ...
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005., 108-109, 2005
1032005
Direct measurement of top and sidewall interface trap density in SOI FinFETs
G Kapila, B Kaczer, A Nackaerts, N Collaert, GV Groeseneken
IEEE electron device letters 28 (3), 232-234, 2007
1022007
BJT effect analysis in p-and n-SOI MuGFETs with high-k gate dielectrics and TiN metal gate electrode for a 1T-DRAM application
M Galeti, M Rodrigues, JA Martino, N Collaert, E Simoen, M Aoulaiche, ...
IEEE 2011 International SOI Conference, 1-2, 2011
942011
The system can't perform the operation now. Try again later.
Articles 1–20