Follow
Philippe Ferrandis
Philippe Ferrandis
Maître de conférences
Verified email at univ-tln.fr
Title
Cited by
Cited by
Year
Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application
Y Boussadi, N Rochat, JP Barnes, BB Bakir, P Ferrandis, B Masenelli, ...
Journal of Luminescence 234, 117937, 2021
462021
Effects of negative bias stress on trapping properties of AlGaN/GaN Schottky barrier diodes
P Ferrandis, M Charles, C Gillot, R Escoffier, E Morvan, A Torres, ...
Microelectronic Engineering 178, 158-163, 2017
152017
Deep-level transient spectroscopy of interfacial states in “buffer-free” pin GaSb/GaAs devices
M Aziz, P Ferrandis, A Mesli, R Hussain Mari, J Francisco Felix, A Sellai, ...
Journal of Applied Physics 114 (13), 2013
132013
Ion-assisted gate recess process induced damage in GaN channel of AlGaN/GaN Schottky barrier diodes studied by deep level transient spectroscopy
P Ferrandis, M Charles, Y Baines, J Buckley, G Garnier, C Gillot, ...
Japanese Journal of Applied Physics 56 (4S), 04CG01, 2017
122017
Growth and characterization of Ge islands on Si (1 1 0)
P Ferrandis, L Vescan
Materials Science and Engineering: B 89 (1-3), 171-175, 2002
122002
Study of deep traps in AlGaN/GaN high-electron mobility transistors by electrical characterization and simulation
philippe Ferrandis, M El-Khatib, MA Jaud, E Morvan, M Charles, G Guillot, ...
Journal of Applied Physics 125 (3), 035702, 2019
102019
Electrical properties of metal/Al2O3/In0. 53Ga0. 47As capacitors grown on InP
P Ferrandis, M Billaud, J Duvernay, M Martin, A Arnoult, H Grampeix, ...
Journal of Applied Physics 123 (16), 2018
82018
Characterization of micro-pixelated InGaP/AlGaInP quantum well structures
Y Boussadi, N Rochat, JP Barnes, BB Bakir, P Ferrandis, B Masenelli, ...
Proc SPIE 11302, 1130221, 2020
52020
Gate length effect on trapping properties in AlGaN/GaN high-electron-mobility transistors
P Ferrandis, M El-Khatib, MA Jaud, E Morvan, M Charles, G Guillot, ...
Semiconductor Science and Technology 34 (4), 045011, 2019
42019
Ferroelectric Bi3. 25La0. 75Ti3O12 thin films on a conductive Sr4Ru2O9 electrode obtained by pulsed laser deposition
R Chmielowski, V Madigou, P Ferrandis, R Zalecki, M Blicharski, ...
Thin solid films 515 (16), 6314-6318, 2007
42007
Analysis of hole-like traps in deep level transient spectroscopy spectra of AlGaN/GaN heterojunctions
P Ferrandis, M Charles, M Veillerot, C Gillot
Journal of Physics D: Applied Physics 53 (18), 185105, 2020
32020
Optical characterisation of Ge islands grown on Si (110)
P Ferrandis, L Vescan, B Holländer
Microelectronics journal 33 (7), 541-546, 2002
32002
Transport properties of a thin GaN channel formed in an Al0. 9Ga0. 1N/GaN heterostructure grown on AlN/sapphire template
J Bassaler, R Comyn, C Bougerol, Y Cordier, F Medjdoub, P Ferrandis
Journal of Applied Physics 131 (12), 2022
22022
Influence of an epitaxial Si capping of Ge islands on Si (0 0 1) and Si (1 1 0) by LPCVD
P Ferrandis, L Vescan, B Holländer, V Dashtizadeh, C Dieker
Physica E: Low-dimensional Systems and Nanostructures 17, 507-509, 2003
22003
Surface defects related to polishing cycle in ß-Ga2O3 crystals grown by floating zone
C Perrier, A Traoré, T Ito, H Umezawa, E Gheeraert, P Ferrandis
Applied Physics Letters 122 (22), 222105, 2023
12023
High Al-content AlGaN channel high electron mobility transistors on silicon substrate
J Mehta, I Abid, J Bassaler, J Pernot, P Ferrandis, M Nemoz, Y Cordier, ...
e-Prime-Advances in Electrical Engineering, Electronics and Energy 3, 100114, 2023
12023
Towards high buffer breakdown field and high temperature stability AlGaN channel HEMTs on silicon substrate
J Mehta, I Abid, J Bassaler, J Pernot, P Ferrandis, S Rennesson, TH Ngo, ...
2022 Compound Semiconductor Week (CSW), 1-2, 2022
12022
Deep traps localization in AlGaN/GaN MIS-HEMTs by a comparative study using capacitance and current deep level transient spectroscopies
M El-Khatib, P Ferrandis, E Morvan, G Guillot, G Brémond
Journal of Physics: Conference Series 1190, 012013, 2019
12019
Anisotropic mobility in AlGaN/GaN heterostructure with thin GaN on AlN/Sapphire template
J Bassaler, R Comyn, C Bougerol, Y Cordier, F Medjdoub, P Ferrandis
WOCSDICE EXMATEC 2022, 2022
2022
Characterization and role of deep traps on the radio frequency performances of high resistivity substrates
E Vandermolen, P Ferrandis, F Allibert, M Nabet, M Rack, JP Raskin, ...
Journal of Applied Physics 129 (21), 2021
2021
The system can't perform the operation now. Try again later.
Articles 1–20