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| Measurement of Ferroelectric Properties of Nanometer Scaled Individual Metal/Hf0.5Zr0.5O2/Metal Capacitors F Huang, M Passlack, Z Yu, Q Lin, A Babadi, VDH Hou, PC McIntyre, ... IEEE Electron Device Letters 43 (2), 212-215, 2021 | 8 | 2021 |
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