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Woojin Jeon
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Grain size engineering for ferroelectric Hf0. 5Zr0. 5O2 films by an insertion of Al2O3 interlayer
HJ Kim, MH Park, YJ Kim, YH Lee, W Jeon, T Gwon, T Moon, KD Kim, ...
Applied Physics Letters 105 (19), 2014
2412014
Highly improved uniformity in the resistive switching parameters of TiO2 thin films by inserting Ru nanodots.
JH Yoon, JH Han, JS Jung, W Jeon, GH Kim, SJ Song, JY Seok, KJ Yoon, ...
Advanced Materials (Deerfield Beach, Fla.) 25 (14), 1987-1992, 2013
1942013
32× 32 crossbar array resistive memory composed of a stacked Schottky diode and unipolar resistive memory
GH Kim, JH Lee, Y Ahn, W Jeon, SJ Song, JY Seok, JH Yoon, KJ Yoon, ...
Advanced Functional Materials 23 (11), 1440-1449, 2013
1872013
High-concentration boron doping of graphene nanoplatelets by simple thermal annealing and their supercapacitive properties
DY Yeom, W Jeon, NDK Tu, SY Yeo, SS Lee, BJ Sung, H Chang, JA Lim, ...
Scientific reports 5 (1), 9817, 2015
1522015
Ferroelectric properties and switching endurance of Hf0.5Zr0.5O2 films on TiN bottom and TiN or RuO2 top electrodes
MH Park, HJ Kim, YJ Kim, W Jeon, T Moon, CS Hwang
physica status solidi (RRL)–Rapid Research Letters 8 (6), 532-535, 2014
1482014
Titanium dioxide thin films for next-generation memory devices
SK Kim, KM Kim, DS Jeong, W Jeon, KJ Yoon, CS Hwang
Journal of Materials Research 28 (3), 313-325, 2013
1062013
Atomic Layer Deposition of SrTiO3 Films with Cyclopentadienyl-Based Precursors for Metal–Insulator–Metal Capacitors
W Lee, JH Han, W Jeon, YW Yoo, SW Lee, SK Kim, CH Ko, ...
Chemistry of Materials 25 (6), 953-961, 2013
832013
Recent advances in the understanding of high-k dielectric materials deposited by atomic layer deposition for dynamic random-access memory capacitor applications
W Jeon
Journal of Materials Research, 1-20, 2019
732019
Structure and Electrical Properties of Al-Doped HfO2 and ZrO2 Films Grown via Atomic Layer Deposition on Mo Electrodes
YW Yoo, W Jeon, W Lee, CH An, SK Kim, CS Hwang
ACS applied materials & interfaces 6 (24), 22474-22482, 2014
732014
WaferScale Synthesis of Reliable HighMobility Molybdenum Disulfide Thin Films via InhibitorUtilizing Atomic Layer Deposition
W Jeon, Y Cho, S Jo, JH Ahn, SJ Jeong
Advanced Materials 29 (47), 1703031, 2017
642017
Frustration of Negative Capacitance in Al2O3/BaTiO3 Bilayer Structure
YJ Kim, MH Park, YH Lee, HJ Kim, W Jeon, T Moon, K Do Kim, DS Jeong, ...
Scientific Reports 6 (1), 19039, 2016
572016
TiO2∕ Al2O3∕ TiO2 Nanolaminated Thin Films for DRAM Capacitor Deposited by Plasma-Enhanced Atomic Layer Deposition
W Jeon, HS Chung, D Joo, SW Kang
Electrochemical and Solid-State Letters 11 (2), H19, 2007
472007
Improved Initial Growth Behavior of SrO and SrTiO3 Films Grown by Atomic Layer Deposition Using {Sr(demamp)(tmhd)}2 as Sr-Precursor
W Lee, W Jeon, CH An, MJ Chung, HJ Kim, T Eom, SM George, BK Park, ...
Chemistry of Materials 27 (11), 3881-3891, 2015
402015
High-throughput fabrication of infinitely long 10 nm slit arrays for terahertz applications
J Jeong, J Rhie, W Jeon, CS Hwang, DS Kim
Journal of Infrared, Millimeter, and Terahertz Waves 36, 262-268, 2015
402015
Interfacial charge-induced polarization switching in Al2O3/Pb (Zr, Ti) O3 bi-layer
YJ Kim, MH Park, W Jeon, HJ Kim, T Moon, YH Lee, KD Kim, SD Hyun, ...
Journal of Applied Physics 118 (22), 2015
372015
Growth of Conductive SrRuO3 Films by Combining Atomic Layer Deposited SrO and Chemical Vapor Deposited RuO2 Layers
JH Han, W Lee, W Jeon, SW Lee, CS Hwang, C Ko, J Gatineau
Chemistry of Materials 24 (24), 4686-4692, 2012
362012
Evaluating the Top Electrode Material for Achieving an Equivalent Oxide Thickness Smaller than 0.4 nm from an Al-Doped TiO2 Film
W Jeon, S Yoo, HK Kim, W Lee, CH An, MJ Chung, CJ Cho, SK Kim, ...
ACS applied materials & interfaces 6 (23), 21632-21637, 2014
332014
Controlling the Al-Doping Profile and Accompanying Electrical Properties of Rutile-Phased TiO2 Thin Films
W Jeon, SH Rha, W Lee, YW Yoo, CH An, KH Jung, SK Kim, CS Hwang
ACS applied materials & interfaces 6 (10), 7910-7917, 2014
292014
Controlling the Electrical Characteristics of ZrO2/Al2O3/ZrO2 Capacitors by Adopting a Ru Top Electrode Grown via Atomic Layer Deposition
CH An, W Lee, SH Kim, CJ Cho, DG Kim, DS Kwon, ST Cho, SH Cha, ...
physica status solidi (RRL)–Rapid Research Letters 13 (3), 1800454, 2019
282019
Impact of Bimetal Electrodes on Dielectric Properties of TiO2 and Al-Doped TiO2 Films
SK Kim, S Han, W Jeon, JH Yoon, JH Han, W Lee, CS Hwang
ACS applied materials & interfaces 4 (9), 4726-4730, 2012
272012
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