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Atousa Jafari
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Year
Impacts of process variations and aging on lifetime reliability of flip-flops: A comparative analysis
A Jafari, M Raji, B Ghavami
IEEE Transactions on Device and Materials Reliability 19 (3), 551-562, 2019
122019
Timing reliability improvement of master-slave flip-flops in the presence of aging effects
A Jafari, M Raji, B Ghavami
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (12), 4761-4773, 2020
92020
BTI-aware timing reliability improvement of pulsed flip-flops in nano-scale CMOS technology
A Jafari, M Raji, B Ghavami
IEEE Transactions on Device and Materials Reliability 21 (3), 379-388, 2021
42021
Reliability of Computing-In-Memory Concepts Based on Memristive Arrays
DJ Wouters, L Brackmann, A Jafari, C Bengel, M Mayahinia, R Waser, ...
2022 International Electron Devices Meeting (IEDM), 5.3. 1-5.3. 4, 2022
32022
Voltage tuning for reliable computation in emerging resistive memories
M Mayahinia, A Jafari, MB Tahoori
2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022
32022
Power Side-Channel Attacks and Countermeasures on Computation-in-Memory Architectures and Technologies
B Sapui, J Krautter, M Mayahinia, A Jafari, D Gnad, S Meschkov, ...
2023 IEEE European Test Symposium (ETS), 1-6, 2023
12023
Design Limitations in Oxide-Based Memristive Ternary Content Addressable Memories
L Brackmann, T Ziegler, A Jafari, DJ Wouters, M Tahoori, S Menzel
2023 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2023
12023
Improved Arithmetic Performance by Combining Stateful and Non‐Stateful Logic in Resistive Random Access Memory 1TíV1R Crossbars
L Brackmann, T Ziegler, A Jafari, DJ Wouters, MB Tahoori, S Menzel
Advanced Intelligent Systems 6 (3), 2300579, 2024
2024
A Spintronic 2M/7T Computation-in-Memory Cell
A Jafari, C Münch, M Tahoori
Journal of Low Power Electronics and Applications 12 (4), 63, 2022
2022
MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories
A Jafari, M Mayahinia, ST Ahmed, C Münch, MB Tahoori
2022 25th Euromicro Conference on Digital System Design (DSD), 332-339, 2022
2022
A failure analysis framework of ReRAM In-Memory Logic operations
L Brackmann, A Jafari, C Bengel, M Mayahinia, R Waser, D Wouters, ...
2022 IEEE International Test Conference in Asia (ITC-Asia), 67-72, 2022
2022
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