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Pu (Luke) Yi
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Probabilistic and Systematic Coverage of Consecutive Test-Method Pairs for Detecting Order-Dependent Flaky Tests.
A Wei, P Yi, T Xie, D Marinov, W Lam
TACAS (1), 270-287, 2021
202021
Preempting flaky tests via non-idempotent-outcome tests
A Wei, P Yi, Z Li, T Xie, D Marinov, W Lam
Proceedings of the 44th International Conference on Software Engineering …, 2022
172022
Finding Polluter Tests Using Java PathFinder
P Yi, A Wei, W Lam, T Xie, D Marinov
ACM SIGSOFT Software Engineering Notes 46 (3), 37-41, 2021
52021
The Stair Sketch: Bringing more Clarity to Memorize Recent Events
Y Zhao, Y Zhang, P Yi, T Yang, B Cui, S Uhlig
38th International Conference on Data Engineering, 2022
42022
PBA: Percentile-Based Level Allocation for Multiple-Bits-Per-Cell RRAM
A Wei, A Levy, P Yi, RM Radway, P Raina, S Mitra, S Achour
2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1-9, 2023
12023
A Theoretical Analysis of Random Regression Test Prioritization
P Yi, H Wang, T Xie, D Marinov, W Lam
International Conference on Tools and Algorithms for the Construction and …, 2022
12022
JPF: From 2003 to 2023
C Artho, P Parízek, D Qu, V Galgali, P Yi
International Conference on Tools and Algorithms for the Construction and …, 2024
2024
Hardware-Aware Static Optimization of Hyperdimensional Computations
PL Yi, S Achour
38th ACM SIGPLAN International Conference on Object-Oriented Programming …, 2023
2023
Initial Results on Counting Test Orders for Order-Dependent Flaky Tests Using Alloy
W Wang, P Yi, S Khurshid, D Marinov
IFIP International Conference on Testing Software and Systems, 123-130, 2021
2021
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