| Semiempirical peak fitting guided by ab initio calculations of X-ray photoelectron spectroscopy narrow scans of chemisorbed, fluorinated silanes BI Johnson, TG Avval, J Wheeler, HC Anderson, A Diwan, KJ Stowers, ... Langmuir 36 (8), 1878-1886, 2020 | 11 | 2020 |
| Eagle XG® glass: Optical constants from 196 to 1688 nm (0.735–6.33 eV) by spectroscopic ellipsometry CV Cushman, BI Johnson, A Martin, BM Lunt, NJ Smith, MR Linford Surface Science Spectra 24 (2), 2017 | 11 | 2017 |
| Oxidation of aluminum thin films protected by ultrathin MgF2 layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy BI Johnson, TG Avval, RS Turley, MR Linford, DD Allred OSA Continuum 4 (3), 879-895, 2021 | 9 | 2021 |
| Using ellipsometry and x-ray photoelectron spectroscopy for real-time monitoring of the oxidation of aluminum mirrors protected by ultrathin MgF2 layers BI Johnson, TG Avval, GT Hodges, V Carver, K Membreno, DD Allred, ... Astronomical Optics: Design, Manufacture, and Test of Space and Ground …, 2019 | 9 | 2019 |
| Optical constants of SiO2 from 196 to 1688 nm (0.735–6.33 eV) from 20, 40, and 60 nm films of reactively sputtered SiO2 on Eagle XG® glass by spectroscopic ellipsometry BI Johnson, CV Cushman, J Rowley, BM Lunt, NJ Smith, A Martin, ... Surface Science Spectra 24 (2), 2017 | 7 | 2017 |
| Pultrusion with abrasion resistant finish J Jambois, J Mosbrucker, AH Johnson, H Goulet, B Johnson US Patent App. 12/204,940, 2009 | 6 | 2009 |
| Substrate protection and deprotection with salt films to prevent surface contamination and enable selective atomic layer deposition D Shah, DI Patel, T Roychowdhury, BI Johnson, MR Linford Applied Surface Science 526, 146621, 2020 | 4 | 2020 |
| Appropriate Backside Roughening is Key for Good Spectroscopic Ellipsometry Analysis of Transparent Materials BI Johnson, G Hodges, C Cushman, J Banerjee, NJ Smith, MR Linford Vac. Technol. Coat 19, 26-33, 2018 | 3 | 2018 |
| Trends in advanced XPS instrumentation. 6. Spectromicroscopy—A technique for understanding the lateral distribution of surface chemistry A Roberts, N Fairley, C Cushman, B Johnson, MR Linford Characterization of Thin Films and Materials, 2017 | 3 | 2017 |
| Oxidation of Aluminum Protected by Wide Band Gap MgF2 Layers as Followed by X-ray Photoelectron Spectroscopy BI Johnson, TG Avval, G Hodges, K Membreno, V Carver, DD Allred, ... spectroscopy (XPS) 10, 15, 2019 | 2 | 2019 |
| Real-Time Monitoring of Aluminum Oxidation Through Wide Band Gap MgF2 Layers for Protection of Space Mirrors BI Johnson, TG Avval, G Hodges, K Membreno, DD Allred, MR Linford | 2 | 2019 |
| Superhydrophobic Surfaces with Very Low Hysteresis Prepared by Aggregation of Silica Nanoparticles During In Situ Urea-Formaldehyde Polymerization A Diwan, DS Jensen, V Gupta, BI Johnson, D Evans, C Telford, ... Journal of Nanoscience and Nanotechnology 15 (12), 10022-10036, 2015 | 2 | 2015 |
| Method of applying an abrasion resistant finish onto a pultrusion substrate J Jambois, J Mosbrucker, AH Johnson, H Goulet, B Johnson US Patent 10,821,473, 2020 | 1 | 2020 |
| Preparation and Detailed X-Ray Photoelectron Spectroscopy and Spectroscopic Ellipsometry Analysis of Ultrathin Protective Coatings BI Johnson Brigham Young University, 2019 | 1 | 2019 |
| Pultrusion with abrasion resistant finish J Jambois, J Mosbrucker, AH Johnson, H Goulet, B Johnson US Patent 11,931,944, 2024 | | 2024 |
| Chemical vapor deposition of thick inorganic coating on a polarizer MR Linford, B Johnson, A Diwan US Patent 11,746,418, 2023 | | 2023 |
| Status of REX-ISOLDE O Forstner, O Kester, J Aeystoe, J Cederkaell, H Fynbo, T Nilsson, ... | | 2001 |
| Trends in Advanced XPS Instrumentation. A Roberts, N Fairley, CV Cushman, BI Johnson, MR Linford, B House, ... | | |
| A Very Incomplete Report on AVS 2016 in Nashville, TN MR Linford, T Roychowdhury, BI Johnson, N Bhardwaj | | |
| XPS Peak Fitting. DI Patel, BI Johnson, D Shah, N Fairley, MR Linford | | |
