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Srikanta Pal
Srikanta Pal
Professor and Former Head of Electronics and Communication Engineering, BIT Mesra, India
在 bitmesra.ac.in 的电子邮件经过验证
标题
引用次数
引用次数
年份
Classification and identification of surface defects in friction stir welding: An image processing approach
R Ranjan, AR Khan, C Parikh, R Jain, RP Mahto, S Pal, SK Pal, ...
Journal of Manufacturing Processes 22, 237-253, 2016
1152016
Tool condition monitoring by SVM classification of machined surface images in turning
NN Bhat, S Dutta, T Vashisth, S Pal, SK Pal, R Sen
The International Journal of Advanced Manufacturing Technology 83, 1487-1502, 2016
762016
Real time monitoring and control of friction stir welding process using multiple sensors
D Mishra, A Gupta, P Raj, A Kumar, S Anwer, SK Pal, D Chakravarty, ...
CIRP Journal of Manufacturing Science and Technology 30, 1-11, 2020
642020
Defect identification in friction stir welding using discrete wavelet analysis
U Kumar, I Yadav, S Kumari, K Kumari, N Ranjan, RK Kesharwani, R Jain, ...
Advances in Engineering Software 85, 43-50, 2015
642015
Tool condition classification in turning process using hidden Markov model based on texture analysis of machined surface images
NN Bhat, S Dutta, SK Pal, S Pal
Measurement 90, 500-509, 2016
602016
Friction stir weld classification by applying wavelet analysis and support vector machine on weld surface images
NN Bhat, K Kumari, S Dutta, SK Pal, S Pal
Journal of Manufacturing Processes 20, 274-281, 2015
532015
1.0 THz GaN IMPATT source: effect of parasitic series resistance
A Biswas, S Sinha, A Acharyya, A Banerjee, S Pal, H Satoh, H Inokawa
Journal of Infrared, Millimeter, and Terahertz Waves 39, 954-974, 2018
522018
Design of super wideband hexagonalshaped fractal antenna with triangular slot
BL Shahu, S Pal, N Chattoraj
Microwave and Optical Technology Letters 57 (7), 1659-1662, 2015
462015
Defect identification in friction stir welding using continuous wavelet transform
S Kumari, R Jain, U Kumar, I Yadav, N Ranjan, K Kumari, RK Kesharwani, ...
Journal of Intelligent Manufacturing 30, 483-494, 2019
442019
Weld defect identification in friction stir welding through optimized wavelet transformation of signals and validation through X-ray micro-CT scan
RB Roy, A Ghosh, S Bhattacharyya, RP Mahto, K Kumari, SK Pal, S Pal
The International Journal of Advanced Manufacturing Technology 99, 623-633, 2018
372018
OAM wave generation using square-shaped patch antenna as slot array equivalence
S Singh, MD Upadhayay, S Pal
IEEE Antennas and Wireless Propagation Letters 19 (4), 680-684, 2020
212020
Dual band notched UWB-BPF based on hybrid microstrip-to-CPW transition
AN Ghazali, M Sazid, S Pal
AEU-International Journal of Electronics and Communications 86, 55-62, 2018
212018
Quad notch UWB antenna using combination of slots and splitring resonator
M Chakraborty, S Pal, N Chattoraj
International Journal of RF and Microwave ComputerAided Engineering 30 (3 …, 2020
202020
A compact super wideband monopole antenna design using fractal geometries
BL Shahu, S Pal, N Chattoraj
Microwave Review 20 (2), 20-24, 2014
182014
Broadband millimeter-wave absorbers: a review
A Choudhary, S Pal, G Sarkhel
International Journal of Microwave and Wireless Technologies 15 (2), 347-363, 2023
172023
Digital Twin-Fundamental Concepts to Applications in Advanced Manufacturing
SK Pal, D Mishra, A Pal, S Dutta, D Chakravarty, S Pal
Springer, 2022
152022
A dual notched band UWB-BPF based on microstrip-to-short circuited CPW transition
AN Ghazali, M Sazid, S Pal
International Journal of Microwave and Wireless Technologies 10 (7), 794-800, 2018
152018
Compact broadband balunbased UWBBPF with minimum insertion loss and sharp selectivity
AN Ghazali, M Sazid, S Pal
Electronics Letters 51 (15), 1174-1175, 2015
152015
Planar UWB filter with multiple notched band and stopband with improved rejection level
AN Ghazali, S Pal
Frequenz 69 (5-6), 207-218, 2015
152015
Compact parallel coupled HTS microstrip bandpass filters for wireless communications
S Pal, CJ Stevens, DJ Edwards
IEEE transactions on microwave theory and techniques 54 (2), 768-775, 2006
152006
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