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Oleksii Liubchenko
Oleksii Liubchenko
researcher, V. LASHKARYOV INSTITUTE OF SEMICONDUCTOR PHYSICS
Verified email at isp.kiev.ua
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Cited by
Year
Features of structural changes in mosaic Ge: Sb according to X-ray diffractometry and electron backscatter diffraction data
MD Borcha, MS Solodkyi, SV Balovsyak, VM Tkach, II Hutsuliak, ...
Semiconductor Physics, Quantum Electronics and Optoelectronics 22 (4), 381-386, 2019
152019
Modification of elastic deformations and analysis of structural and optical changes in Ar+-implanted AlN/GaN superlattices
O Liubchenko, T Sabov, V Kladko, V Melnik, V Yukhymchuk, B Romanyuk, ...
Applied Nanoscience 10, 2479-2487, 2020
92020
Ar-implanted vanadium dioxide thin film with the reduced phase transition temperature
O Liubchenko, V Kladko, V Melnik, B Romanyuk, O Gudymenko, T Sabov, ...
Materials Letters 314, 131895, 2022
72022
The effect of ion implantation on structural damage in compositionally graded AlGaN layers
OI Liubchenko, VP Kladko, HV Stanchu, TM Sabov, VP Melnik, SB Kryvyi, ...
Semiconductor physics, quantum electronics & optoelectronics, 119-129, 2019
52019
Modeling of X-ray rocking curves for layers after two-stage ion-implantation
OI Liubchenko, VP Kladko, OY Gudymenko
Semiconductor physics, quantum electronics & optoelectronics, 355-361, 2017
52017
X-ray analysis for micro-structure of AlN/GaN multiple quantum well systems
OI Liubchenko, VP Kladko, TM Sabov, OV Dubikovskyi
Journal of Materials Science: Materials in Electronics 30, 499-507, 2019
42019
Formation and Transient Photovoltaic Properties of ZnO/Si Isotype Heterojunctions by Magnetron Sputtering
V Melnik, B Romanyuk, V Kladko, V Popov, O Gudymenko, O Liubchenko, ...
Nanomaterials and Nanocomposites, Nanostructure Surfaces, and Their …, 2021
32021
Semiconductor Physics, Quantum Electronics and Optoelectronics, 22
MD Borcha, MS Solodkyi, SV Balovsyak, VM Tkach, II Hutsuliak, ...
32019
The elemental composition mixing in a Mo/Si multilayer structure under overheating
O Oberemok, T Sabov, O Dubikovskyi, O Kosulya, V Melnik, B Romanyuk, ...
Materials Today: Proceedings 35, 579-583, 2021
22021
Simulation of X-ray diffraction spectra for AlN/GaN multiple quantum well structures on AlN (0001) with interface roughness and variation of vertical layers thickness
OI Liubchenko, VP Kladko
Металлофизика и новейшие технологии, 2018
22018
Effect of structural disorder on the modification of V–V and V–O bond lengths at the metal-dielectric phase transition in VO2 thin films
VV Strelchuk, OF Kolomys, DM Maziar, VP Melnik, BM Romanyuk, ...
Materials Science in Semiconductor Processing 174, 108224, 2024
12024
Alternative Route of Fracturing in GaN Films Formed by Nanowires Coalescence on Si Substrate
S Kryvyi, H Stanchu, O Liubchenko, N Safriuk-Romanenko, A Kuchuk, ...
Crystal Growth & Design 22 (5), 3264-3270, 2022
12022
Phase transition in vanadium oxide films formed by multistep deposition
VP Kladko, VP Melnik, ОI Liubchenko, BM Romanyuk, ОY Gudymenko, ...
Semiconductor Physics, Quantum Electronics & Optoelectronics 24 (4), 362-371, 2021
12021
Дослідження процесів формування фотодіодів в InSb при іонній імплантації берилію
ЮВ Голтвянський, ОЙ Гудименко, ОВ Дубіковський, ОІ Любченко, ...
Оптоэлектроника и полупроводниковая техника 52, 141-150, 2017
12017
Implementation of Cyclical Processes in the Moisture Electricity Generation for Continuous Operation
YY Bacherikov, O Okhrimenko, O Liubchenko, V Ponomarenko, ...
Energy Technology, 2301245, 2024
2024
Thermometry of AlGaN/GaN 2D Channels at High Electric Fields Using Electrical and Optical Methods
S Vitusevich, IM Nasieka, AV Naumov, VV Kalyuzhnyi, OI Liubchenko, ...
Advanced Electronic Materials 9 (6), 2201330, 2023
2023
Voltage generation in hydrated calcium structures
G Tarasov, V Kidalov, A Sadigov, O Okhrimenko, A Lyubchyk, ...
Запоріжжя: 2022, 2022
2022
Investigation of traps in AlGaN/GaN heterostructures by ultrasonic vibrations
VV Kaliuzhnyi, OI Liubchenko, MD Tymochko, YM Olikh, VP Kladko, ...
Ukrainian journal of physics 66 (12), 1058-1058, 2021
2021
Structural modifications in laser-annealed PdSi alloys characterized by total scattering measurements
O Liubchenko, J Antonowicz, K Sokolowski-Tinten, P Zalden, ...
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