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Co-authors
Qing LiuAssociate Professor, New Jersey Institute of TechnologyVerified email at njit.edu- Norbert PodhorszkiScientific Data Group, Oak Ridge National LaboratoryVerified email at ornl.gov
- Scott KlaskyOak Ridge National LaboratoryVerified email at ornl.gov
- Jinzhen WangBrooklyn College of City University of New YorkVerified email at brooklyn.cuny.edu
- Eric SuchytaOak Ridge National LaboratoryVerified email at ornl.gov
- Jong Youl ChoiOak Ridge National LaboratoryVerified email at ornl.gov
- Xubin HeTemple UniversityVerified email at temple.edu
- Matthew WolfSamsung Seminconductor, Inc.Verified email at samsung.com
- Hong JiangUniversity of Texas at ArlingtonVerified email at uta.edu
- Dan HuangUniversity of Central Florida, Georgia State University, southeast universityVerified email at eecs.ucf.edu
- MengChu ZhouNJITVerified email at njit.edu
- Jieyang ChenUniversity of Alabama at Birmingham, Oak Ridge National Laboratory, University of CaliforniaVerified email at ornl.gov
- Haitao Yuan (苑海涛)New Jersey Institute of Technology, NJ, USA, and Beihang University, Beijing, ChinaVerified email at njit.edu
