| Triethanolamine doped multilayer MoS 2 field effect transistors MY Ryu, HK Jang, KJ Lee, M Piao, SP Ko, M Shin, J Huh, GT Kim Physical Chemistry Chemical Physics 19 (20), 13133-13139, 2017 | 42 | 2017 |
| Controlling charge balance using non-conjugated polymer interlayer in quantum dot light-emitting diodes J Yun, J Kim, HK Jang, KJ Lee, JH Seo, BJ Jung, G Kim, J Kwak Organic Electronics 50, 82-86, 2017 | 26 | 2017 |
| Hot-electron-induced punch-through (HEIP) effect in p-MOSFET enhanced by mechanical stress K Lee, B Kaczer, A Kruv, M Gonzalez, R Degraeve, S Tyaginov, A Grill, ... IEEE Electron Device Letters 42 (10), 1424-1427, 2021 | 14 | 2021 |
| Understanding tunable photoresponsivity of two-dimensional multilayer phototransistors: Interplay between thickness and carrier mobility YS Moon, JH Shon, D Kim, K Lee, MK Joo, GT Kim Applied Physics Letters 116 (18), 2020 | 14 | 2020 |
| Understanding of the aging pattern in quantum dot light-emitting diodes using low-frequency noise K Lee, J Yun, S Lee, J Song, Y Kim, J Kwak, GT Kim Nanoscale 12 (29), 15888-15895, 2020 | 13 | 2020 |
| Transfer of transition-metal dichalcogenide circuits onto arbitrary substrates for flexible device applications H Lee, K Lee, Y Kim, H Ji, J Choi, M Kim, JP Ahn, GT Kim Nanoscale 11 (45), 22118-22124, 2019 | 11 | 2019 |
| Modeling and Understanding the Compact Performance of h‐BN Dual‐Gated ReS2 Transistor K Lee, J Choi, B Kaczer, A Grill, JW Lee, S Van Beek, E Bury, ... Advanced Functional Materials, 2100625, 2021 | 10 | 2021 |
| Real-time effect of electron beam on MoS2 field-effect transistors K Lee, H Lee, Y Kim, J Choi, JP Ahn, DH Shin, YH Cho, H Jang, SW Lee, ... Nanotechnology 31 (45), 455202, 2020 | 10 | 2020 |
| Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation K Lee, S Nam, H Ji, J Choi, JE Jin, Y Kim, J Na, MY Ryu, YH Cho, H Lee, ... npj 2D Materials and Applications 5 (1), 1-9, 2021 | 8 | 2021 |
| Detection and Accurate Classification of Mixed Gases Using Machine Learning with Impedance Data K Lee, S Nam, H Kim, DY Jeon, D Shin, HG Lim, C Kim, D Kim, Y Kim, ... Advanced Theory and Simulations, 2000012, 2020 | 8 | 2020 |
| Gate-induced-drain-leakage (GIDL) in CMOS enhanced by mechanical stress K Lee, B Kaczer, A Kruv, M Gonzalez, G Eneman, OO Okudur, A Grill, ... IEEE Transactions on Electron Devices 69 (4), 2214-2217, 2022 | 7 | 2022 |
| Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET K Lee, Y Kim, H Lee, S Park, Y Lee, MK Joo, H Ji, J Lee, J Chun, M Sung, ... Nanotechnology 32 (16), 165202, 2021 | 7 | 2021 |
| Cyclic Thermal Effects on Devices of Two‐Dimensional Layered Semiconducting Materials Y Kim, B Kaczer, D Verreck, A Grill, D Kim, J Song, J Diaz‐Fortuny, A Vici, ... Advanced Electronic Materials, 2100348, 2021 | 5 | 2021 |
| Soft-type trap-induced degradation of MoS2 field effect transistors YH Cho, MY Ryu, KJ Lee, SJ Park, JH Choi, BC Lee, W Kim, GT Kim Nanotechnology 29 (22), 22LT01, 2018 | 4 | 2018 |
| Classifiable Limiting Mass Change Detection in a Graphene Resonator Using Applied Machine Learning M Seo, E Yang, DH Shin, Y Je, C Joo, K Lee, SW Lee ACS Applied Electronic Materials 4 (11), 5184-5190, 2022 | 2 | 2022 |
| Impact of Externally Induced Local Mechanical Stress on Electrical Performance of Decananometer MOSFETs K Lee, B Kaczer, A Kruv, M Gonzalez, G Eneman, OO Okudur, A Grill, ... IEEE Transactions on Electron Devices 69 (9), 5382-5385, 2022 | 1 | 2022 |
| Significant enhancement of HCD and TDDB in CMOS FETs by mechanical stress K Lee, B Kaczer, A Kruv, M Gonzalez, G Eneman, OO Okudur, A Grill, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 10A. 3-1-10A. 3-6, 2022 | 1 | 2022 |
| Development of Portable Measurement Unit with Wireless Transmission by Wireless LAN for Long-term Monitoring SJ Park, IH Park, YS Moon, KJ Lee, GT Kim Journal of the Semiconductor & Display Technology 17 (1), 45-49, 2018 | 1 | 2018 |
| Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications K Lee, H Ji, Y Kim, B Kaczer, H Lee, JP Ahn, J Choi, A Grill, L Panarella, ... Advanced Materials Interfaces 9 (9), 2102488, 2022 | | 2022 |
| Metal-Contact Improvement in a Multilayer WSe2 Transistor through Strong Hot Carrier Injection K Lee, Y Kim, D Kim, J Lee, H Lee, MK Joo, YH Cho, J Shin, H Ji, GT Kim ACS Applied Materials & Interfaces 13 (2), 2829-2835, 2021 | | 2021 |
Junhee ChoiKRIT, Senior ResearcherVerified email at krit.re.kr
