| Influence of anisotropic surface diffusivity on electromigration induced void migration and evolution DR Fridline, AF Bower Journal of applied physics 85 (6), 3168-3174, 1999 | 96 | 1999 |
| Numerical simulations of stress induced void evolution and growth in interconnects D Fridline, A Bower Journal of applied physics 91 (4), 2380-2390, 2002 | 26 | 2002 |
| In-situ optical crack measurement using a dot pattern RJ Christ Jr, JA Nardiello, JM Papazian, DR Fridline US Patent App. 12/608,497, 2011 | 23 | 2011 |
| SIPS, a structural integrity prognosis system JM Papazian, EL Anagnostou, S Engel, D Fridline, D Hoitsma, J Madsen, ... 2007 IEEE Aerospace Conference, 1-10, 2007 | 15 | 2007 |
| DARPA/NCG structural integrity prognosis system J Papazian, EL Anagnostou, RJ Christ, SJ Engel, D Fridline, D Hoitsma, ... HR0011-04 in, DARPA, Arlington, VA, 2009 | 11 | 2009 |
| Fatigue and crack-growth analyses on specimens simulating details in wing panels of naval aircraft JC Newman, JB Jordon, EL Anagnostou, D Fridline, D Rusk Aging aircraft conference, Phoenix, AZ, 2008 | 11 | 2008 |
| HR0011-04-C-0003 J Papazian, EL Anagnostou, RJ Christ, SJ Engel, D Fridline, D Hoitsma, ... DARPA, Arlington, VA, 2009 | 7 | 2009 |
| System Design Considerations for Using a Direct-Attached-Ceramic MMC Power Package DC Hopkins, JM Pitarresi, DR Fridline, JA Karker PROCEEDINGS OF THE INTERNATIONAL INTELLIGENT MOTION CONFERENCE, 683-690, 1996 | 7 | 1996 |
| Science-based multiscale modeling of fatigue damage for structural prognosis E Anagnostou, S Engel, D Fridline, D Hoitsma, J Madsen, J Papazian, ... 51st AIAA/ASME/ASCE/AHS/ASC structures, structural dynamics, and materials …, 2010 | 5 | 2010 |
| Structural integrity prognosis JM Papazian, EL Anagnostou, S Engel, D Fridline, D Hoitsma, J Madsen, ... Proc. of the e24th Int. Conf. on Aircraft Fatigue Symp, 14-18, 2007 | 5 | 2007 |
| Finite element modeling of electromigration and stress voiding in microelectronic interconnects DR Fridline Brown University, 2001 | 5 | 2001 |
| Finite element analysis of electromigration and stress in interconnects AF Bower, D Fridline, A Kumar, CF Shih, L Xia, YW Zhang AIP Conference Proceedings 418 (1), 291-302, 1998 | 3 | 1998 |
| CONDENSED MATTER: Structure, Mechanical, and Thermal Properties (PACS 61-68)-Influence of anisotropic surface diffusivity on electromigration induced void migration and evolution DR Fridline, AF Bower Journal of Applied Physics 85 (6), 3168-3174, 1999 | 1 | 1999 |
